Comparison of Mid-Infrared Regular Transmittance Measurement

Guo Jin Feng; Yu Wang; Ping Li; Ting Ting Guo

doi:10.4028/www.scientific.net/AMM.239-240.176

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 239-240Comparison of Mid-Infrared Regular Transmittance...

Comparison of Mid-Infrared Regular Transmittance Measurement

Abstract:

To ensure measurement accuracy and reliable, and adapt to the development of the infrared transmittance calibration needs in China, this paper introduces the mid-infrared regular transmittance bilateral comparison organized by the China National Institute of Metrology. This comparison mainly focused on the wavelength band of 4000 cm^-1-400cm^-1(2.5μm -20μm). Technical protocol, facilities, measurement methods and conditions, and uncertainties from the participating laboratories have also been introduced.

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Periodical:

Applied Mechanics and Materials (Volumes 239-240)

Pages:

176-180

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.239-240.176

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Online since:

December 2012

Authors:

Guo Jin Feng, Yu Wang, Ping Li, Ting Ting Guo

Keywords:

Comparison, Fourier Transform Infrared Spectroscopy (FTIR), Mid-Infrared Transmittance, Standard Transmittance Substance

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