Analog Circuits Test by Using Principal Component Analysis

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In view of the difficulties caused by determining threshold for analog circuits test, a method based on principal component analysis (PCA) of node voltages was proposed to overcome these difficulties. At first, the principal component model of fault-free circuits was constructed. Then the circuits-under-test was compared with the principal component model to calculate the statistic for fault detection. The proposed method was used to test the output signal amplifying circuit, which is used in the ultrasonic liquid sensor. The testing results show that the PCA based method has a higher sensitivity than other test methods. And the proposed method can overcome the difficulties in determining threshold by the expert’s empirical knowledge. These make it a suitable candidate for analog circuits test.

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709-713

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January 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] M. Aminian, and F. Aminian: Neural-network based analog circuits fault diagnosis using wavelet transform as preprocessor, IEEE Transactions on Circuits and Systems II, Analog and Digital Signal Processing, vol. 47, no. 2 (2000), pp.151-156.

DOI: 10.1109/82.823545

Google Scholar

[2] B. K. S. V. L. Varaprasad, L. M. Patnaik, H. S. Jamadagni, and V. K. Agrawal: A new ATPG technique (MultiDetect) for testing of analog macros in mixed-signal circuits, IEEE Tran. Computer-Aided Design of Integr. Circuits Syst., vol. 23, no. 2 (2004).

DOI: 10.1109/tcad.2003.822110

Google Scholar

[3] C. Zhang, G. He, and S. Liang: Test point selection of analog circuits based on fuzzy theory and ant colony algorithm, in Proceedings of IEEE AUTOTESTCON (2008), pp.164-168.

DOI: 10.1109/autest.2008.4662605

Google Scholar

[4] A. A. Hatzopoulos, E. Latrou, C. Katsaras, and D. K. Papakostas:Testing of analog and mixed- signal circuits by using supply current measurements, IEE Proceedings of Circuits, Devices and Systems, vol. 145, no. 5 (1998), pp.319-324.

DOI: 10.1049/ip-cds:19982118

Google Scholar

[5] D. K. Papakostas, and A. A. Hatzopoulos: Analogue fault detectability comparison between power supply current and output voltage magnitude and phase spectrum components, Electronics Letters, vol. 40, no. 8 (2004), pp.457-458.

DOI: 10.1049/el:20040334

Google Scholar

[6] G. Gielen, Z. Wang, and W. Sansen: Fault detection and input stimulus determination for the testing of analog integrated circuits based on power-supply current monitoring, in Proceedings of the IEEE/ACM International Conference on Computer-aided Design (1994).

DOI: 10.1109/iccad.1994.629866

Google Scholar

[7] S. Bhunia, and K. Roy: Dynamic supply current testing of analog circuits using wavelet transform, in Proceedings of the 20th IEEE VLSI Test Symposium (2002), pp.302-307.

DOI: 10.1109/vts.2002.1011158

Google Scholar

[8] G. R. Halligan and S. Jagannathan: PCA-based fault isolation and prognosis with application to pump, International Journal of Advanced Manufacturing Technology, vol. 55, no. 5-8 (2011), pp.699-707.

DOI: 10.1007/s00170-010-3096-2

Google Scholar

[9] J. C. Jeng: Adaptive process monitoring using efficient recursive PCA and moving window PCA algorithms, Journal of the Taiwan Institute of Chemical Engineers, vol. 41, no. 4 (2010), pp.475-481.

DOI: 10.1016/j.jtice.2010.03.015

Google Scholar

[10] H. Zhang, A. K. Tangirala, and S. L. Shah: Dynamic process monitoring using multiscale PCA, in Proceedings of the IEEE Canadian Conference on Electrical and Computer Engineering (1999), pp.1579-1584.

DOI: 10.1109/ccece.1999.804948

Google Scholar