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A BIST Structure for ADC in Mixed-Signal SOC

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Abstract:

A BIST structure for ADC test in Mixed-Signal SOC to characterize both the dynamic and static parameters was presented. A Sigma-Delta modulation based sinewave generator was built on the chip. The frequency, amplitude and phase of the sinusoidal signal can be adjusted through proper selecting generator parameters which are stored in ADC WBR. The response analyzer was built up from the memory and computational resource in the SOC.

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Periodical:

Applied Mechanics and Materials (Volumes 278-280)

Pages:

950-953

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.278-280.950

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Online since:

January 2013

Authors:

Shi Rong Yin, Chao Tao Liu

Keywords:

ADC Test, BIST, Mixed-Signal SOC

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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References

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