Novel Automatic Measurement System for the TCR Test of Multi Quantum Well with High Precision

Tong Zhou; Tao Dong; Yan Su

doi:10.4028/www.scientific.net/AMM.281.146

Paper Titles

Research on Multivariable Model Reference Variable Structure Control
p.121

Super-Optimal Pairings
p.127

Flow Control Research between ForCES Channels
p.134

A Specific Methodology of Creep Compensation for Piezoelectric Actuators by Open-Loop Control
p.141

Novel Automatic Measurement System for the TCR Test of Multi Quantum Well with High Precision
p.146

Study on Control Algorithm of Wind-Solar Hybrid Generation System
p.151

The Building of Composite Materials Information System Based on Internet of Things Technology
p.155

Research on the Driver's Following Behavior Based on Hybrid Electric Vehicle Model
p.159

The Finite Element Analysis and Optimization for the Grinder Based on the Joint Surface
p.165

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 281Novel Automatic Measurement System for the TCR...

Novel Automatic Measurement System for the TCR Test of Multi Quantum Well with High Precision

Abstract:

A novel automatic measurement system for the TCR(temperature coefficient of resistance) test of multi quantum well which is one kind of IR and biomedical materials used in pathogen detection is presented. The system is constructed to solve the problem that conventional four-probe measurements are not suitable for multi quantum well because of the special structure of multi quantum well material. The practical application of the system demonstrates the system measurement error is less than 0.005% of the sample resistance. The results of experiment show that this system has good performances in multi quantum well measurement.

You might also be interested in these eBooks

Mechanical Engineering, Materials and Energy II

View Preview

Info:

Periodical:

Applied Mechanics and Materials (Volume 281)

Pages:

146-150

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.281.146

Citation:

Cite this paper

Online since:

January 2013

Authors:

Tong Zhou, Tao Dong, Yan Su

Keywords:

Characteristics of Material, Multi Quantum Well, TCR Measurement System

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] L. Zhang, et al., A Novel MEMS Based Infrared Biosensor for Ultra-sensitive Detection of Waterborne Pathogens, presented at the The IEEE International Conference on Remote Sensing, Environment and Transportation Engineering (RSETE 2012), Nanjing, China, (2012).

DOI: 10.1109/rsete.2012.6260364

Google Scholar

[2] HH. Radamson, M. Kolahdouz, and S. Shayestehaminzadeh, Carbon-doped single-crystalline SiGe/Si thermistor with high temperature coefficient of resistance and low noise level, Appl Phys Lett, vol. 97, p.223507, (2010).

DOI: 10.1063/1.3524211

Google Scholar

[3] DK. Schroder. Semiconductor material and device characterization( 3rd ED. ). John Wiley&Sons, Inc., Hoboken, New Jersey, (2006).

Google Scholar

[4] JL. Tissot, C. Trouilleau, B. Fieque, A. Crastes, O. Legras, The performance improvement evaluation for SiGe-based IR detectors, Opto-Electron, vol. 14, pp.25-32, (2006).

DOI: 10.2478/s11772-006-0004-2

Google Scholar

[5] M. Garcia, IR bolometers based on amorphous silicon germanium alloys, Noncryst Solids, vol. 744-8, pp.338-340, (2004).

DOI: 10.1016/j.jnoncrysol.2004.03.082

Google Scholar

[6] L. Georgios, Voltage Distribution of Two Thin Polymeric Film Surface Resistance Measurement Systems, IEEE Transactions on instrumentation and measurement, vol. 40, pp.635-639, (1991).

DOI: 10.1109/19.87033

Google Scholar

[7] W. Stanley, H. Linda, and A. Jan, High Signal to Noise Ratio Quantum Well Bolometer Materials, Optical Materials in Defence Systems Technology, vol. 6401, pp. 64010N (2006).

Google Scholar