Variability Analysis of Pi Network Impedance Matching

Abstract:

Harmonic rejection ability and reflection coefficient are the most important factors in the design of impedance matching network. However, stability of impedance matching should be taken into account in applications existing load impedance variation and component deviation due to tolerance and process variation. This paper investigates variability of Pi network impedance matching analytically. The relationships between resulting reflection coefficient with component deviation and load impedance variation are theoretically derived on the basis of Q-based design method. The deviation from perfect match due to component deviation is proportional to quality factor. Higher quality factor probably means poorer quality in terms of variability. The resulting reflection coefficient caused by load impedance variation increases rapidly when the load reflection coefficient is larger than 0.66. A small variation in the load impedance will cause a large deviation from perfect match when the impedance difference between load and source is quite large.

• Periodical: Applied Mechanics and Materials (Volumes 291-294)
• Pages: 2527-2531
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.291-294.2527
• Online since: February 2013
• Authors: Jian Wen Tan, Si Jian Deng, Fang Wei Ye, De Ping Zeng
• Keywords: Circuit Analysis, Component Tolerance, Impedance Matching, Variability Analysis

References

[1] Chung B.K.: Q-based design method for T network impedance matching, Microelectronics J., 2006, 37, (9), p.1007–1011.

DOI: 10.1016/j.mejo.2006.01.019

[2] Motorola Application Note AN-721: Impedance matching networks applied to RF power transistors, Motorola Inc., (1993).

[3] Gilbert E.: Impedance matching with lossy components, IEEE Trans. Circuits Syst., 1975, 22, (2), p.96–100.

DOI: 10.1109/tcs.1975.1084016

[4] Thompson M., Fidler J.K.: Determination of the impedance matching domain of impedance matching networks, IEEE Trans. Circuits Syst. I: Regular Papers, 2004, 51, (10), p.2098–2106.

DOI: 10.1109/tcsi.2004.835682

[5] Liao R.J., Tan J.W., Wang H.: Q-based design method for impedance matching network considering load variation and frequency drift, Microelectron. J., 2011, 42, (2), p.403–408.

DOI: 10.1016/j.mejo.2010.09.013

[6] Chen F, Weber R.J.: A novel process-variation insensitive network for on-chip impedance matching, IEEE Int. Symp. Commun. Inf. Technol. (ISCIT), 2004, (1), pp.43-46.

DOI: 10.1109/iscit.2004.1412446

[7] Nieuwoudt A, Ragheb T, Nejati H, Massoud Y.: Variation tolerant design methods for wideband low noise amplifiers, Analog Integr. Circ. S., 2009, 58, (1), p.49–54.

DOI: 10.1007/s10470-008-9212-7

[8] Hastings A.: The art of analog layout, (Prentice-Hall Inc., 2001), p.200–203.

[9] Dogra V.S., Zhang M., Bhatt S.: High-intensity focused ultrasound (HIFU) therapy applications, Ultrasound Clin., 2009, 4, (3), p.307–21.

DOI: 10.1016/j.cult.2009.10.005

[10] Chung B.K.: Variability analysis of impedance matching network, Microelectron. J., 2006, 37, (1), p.419–23.

[11] Sun Y., Fidler J.K.: Design method for impedance matching networks, IEE Conf. Proc. Circuits Devices Syst., 1996, 143, (4), p.186–94.

DOI: 10.1049/ip-cds:19960566

[12] Bowick C.: RF Circuit Design, (Newnes, 1997), p.63–102.