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The Characteristics of ESD Protection Device Based on Static Induction Thyristors

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Abstract:

A novel structure of ESD protection device based on the static induction thyristors (SITh) was in further investigation. Detailed analysis of the negative resistance characteristics of SITh was presented, especially its blocking and conducting states that satisfy the requirements in ESD events. The characteristics of SITh for ESD protection were obtained using the Time Domain Reflectometer (TDR) type of Transmission Line Pulse (TLP) testing system. The results illustrate that SITh for ESD protection has the following advantages: 1) It has a strong ESD stress handing capability (3.75 kV); 2) Its second breakdown current is large enough (2.5 A) to release great ESD current; 3) DC leakage current of SITh is very small (1 μA); 4) SITh can break through the limitations of transitional trigger voltages, whose trigger voltage is dynamically adjustable as well; 5) The ESD response time can be controlled through optimizing device structure of SITh.

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Periodical:

Applied Mechanics and Materials (Volumes 303-306)

Pages:

1803-1807

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.303-306.1803

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Cite this paper

Online since:

February 2013

Authors:

Jian Hong Yang, Lin Jiao Zhang, Fei Hu Zhao

Keywords:

Electro-Static Discharge (ESD), Robustness, Static Induction Thyristors (SITh), Transmission Line Pulse (TLP) Test

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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