Embedded Digital Control System of the Automatic Test System

Article Preview

Abstract:

This text has introduced a set of automatic test systems that designs for and a kind of embedded digital control system ' and demand to design a kind of indicative test to system testing It describe rules by language (this system from computer as controlling core ,interactive user interfaces good ,realized in protecting the real-time test of high speed under the mode.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

461-465

Citation:

Online since:

July 2013

Authors:

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Sharma A K was written, once lustrous and transparent, Wu Dong, Sun Lei, etc. translated. Structure of the advanced semi-conductive memory one, design and application. Beijing: Electronic Industry Press, 2005: 355-356.

Google Scholar

[2] Chheda S, Chittamuru J K, and Moritz C A. Memory systems: overview and trends. http: / / www-unix. ec8. um. edu/ -jchittnm/ memorysys. pdf, 2008, 10.

Google Scholar

[3] Ngm T, Rose J, and Wilton S J E. An SRAM-programmable field-configurable memory. IEEE Custom Integrated Circuits Conference, May 1995: 499-502.

DOI: 10.1109/cicc.1995.518232

Google Scholar

[4] Wilton S J E, Rose J, and Vranesic Z G, et a1. Architecture of centralized field-configurable memory. Proceedings of the Third International ACM Symposium. 1995: 97-103.

DOI: 10.1109/fpga.1995.242047

Google Scholar