Used Surface Plasma Wave Measure the Thickness and the Negative Permittivity of Nanometal Film

Rong Jiang; Zhi Xun Huang; Nai Cheng Shen; Xin Meng Liu

doi:10.4028/www.scientific.net/AMM.341-342.971

Paper Titles

Action Decision Strategy of Simulation Robot Fish Based on Ant Colony Algorithm
p.949

Comprehensive CEP Evaluation Method for Calculating Positioning Precision of Navigation Systems
p.955

The Application Research of Coal Seam CO Source Identification Based on the D-S Evidence Conflict
p.961

Vibration Analysis and Control of an Active Power-Train Mount System
p.966

Used Surface Plasma Wave Measure the Thickness and the Negative Permittivity of Nanometal Film
p.971

Research of Face Recognition System Based on TMS320DM642
p.975

Constraint and Motion Analysis of a Hybrid Mechanism
p.980

A Hybrid Testing Method to the Application of Test Case Generation of the Simulation of CTCS-3 On-Board Subsystem
p.984

An Improved Software Synchronous Sampling Method in the Electrical Signal Parameters Measurement
p.990

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 341-342Used Surface Plasma Wave Measure the Thickness and...

Used Surface Plasma Wave Measure the Thickness and the Negative Permittivity of Nanometal Film

Abstract:

In this paper we used He-Ne laser with 632.8nm and prism with aurum film to do the experiment, used Kretschmann configuration excite the surface plasma waves (SPW) on the prism with aurum film,and measure the attenuated total reflection (ATR) spectrum. The thickness of the nanofilm and the negative permittivity of the aurum were obtained.