Optical Module for Distinguishing Real and Fake Cracks in LCD and OLED Glass Boards

Article Preview

Abstract:

We developed an optical module for distinguishing true and fake cracks in LCD and OLED glass board conveyer. We used a pulse modulated infrared laser to improve the functionality of distinguishing true and fake cracks formed at the edges of glass board. The conventional optical detection algorism sensing real cracks modified to reduce any misinformation of fake crack for true crack. We discussed the optimum operational conditions as functions of pulse modulation frequency and wavelength of the laser, transport speed of glass board, spot size and working distance of a focused laser beam.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

232-236

Citation:

Online since:

September 2013

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Shun-Sheng Ko, Chien-Sheng Liu, Yang-Cheng Lin, Optical inspection system with tunable exposure unit for micro-crack detection in solar wafers, Optik (2013) in press.

DOI: 10.1016/j.ijleo.2012.12.024

Google Scholar

[2] C. Hilmersson, D.P. Hess, W. Dallas, S. Ostapenko, Crack detection in single-crystalline silicon wafers using impact testing, Applied Acoustics 69 (2008) 755–760.

DOI: 10.1016/j.apacoust.2007.03.002

Google Scholar

[3] Jason Chao-Hsien Pan, Damon HE Tai, A new strategy for defect inspection by the virtual inspection in semiconductor wafer fabrication, Computers & Industrial Engineering 60 (2011) 16–24.

DOI: 10.1016/j.cie.2010.09.008

Google Scholar

[4] Du-Ming Tsai, Chih-Chieh Chang, Shin-Min Chao, Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion, Image and Vision Computing 28 (2010) 491–501.

DOI: 10.1016/j.imavis.2009.08.001

Google Scholar

[5] Jian Shen, Shouhua Liu, Kui Yi, Hongbo He, Jianda Shao, Zhengxiu Fan, Subsurface damage in optical substrates, Optik 116 (2005) 288–294.

DOI: 10.1016/j.ijleo.2005.02.002

Google Scholar

[6] M.M. Tehranchi, S.M. Hamidi, H. Eftekhari, M. Karbaschi, M. Ranjbaran, The inspection of magnetic flux leakage from metal surface cracks by magneto-optical sensors, Sensors and Actuators A 172 (2011) 365– 368.

DOI: 10.1016/j.sna.2011.09.010

Google Scholar

[7] M.S. Safizadeh, T. Azizzadeh, Corrosion detection of internal pipeline using NDT optical inspection system, NDT&E International 52 (2012) 144–148.

DOI: 10.1016/j.ndteint.2012.07.008

Google Scholar

[8] Su-Hwan Kim, Jee-Hyun Kim, Shin-Won Kang, Nondestructive defect inspection for LCDs using optical coherence tomography, Displays 32 (2011) 325–329.

DOI: 10.1016/j.displa.2011.04.002

Google Scholar

[9] C. Quan, S.H. Wang, C.J. Tay, I. Reading, Z.P. Fang, Integrated optical inspection on surface geometry and refractive index distribution of a microlens array, Optics Communications 225 (2003) 223–231.

DOI: 10.1016/j.optcom.2003.07.045

Google Scholar

[10] EGiS-crack, Information on http: /www. semisysco. com.

Google Scholar