Based on the DT-CWT Transformation Methods for 3D-Nanometer Roughness Rating Reference

Zhi Ying Ren; Cheng Hui Gao; Jian Xing Lin; Ding Shen

doi:10.4028/www.scientific.net/AMM.395-396.769

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 395-396Based on the DT-CWT Transformation Methods for...

Based on the DT-CWT Transformation Methods for 3D-Nanometer Roughness Rating Reference

Abstract:

This paper proposes the third generation wavelet--double tree complex wavelet (DT-CWT) transformation used in nanometer roughness rating, based on the explanation of the shortcomings of the current nanometer roughness rating reference and conventional three dimensional datum evaluations due to the insufficient study. The experiment got porous anodic alumina film as the object of surface roughness of nanotechnology study. Through the comparisons of the three generations of the wavelet reconstruction after the maximum reconstruction error, a conclusion can be made that the superiority of DT-CWT in application is very obvious, a result meeting the16% principle of the surface roughness rating on the bases of DT - CWT extracted datum to compute income parameters, which indicates the feasibility of this application to the extraction of the nano3-D roughness evaluation. Keywords: nanometer roughness;dual-tree complex wavelet;three dimensional datum

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Periodical:

Applied Mechanics and Materials (Volumes 395-396)

Pages:

769-773

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.395-396.769

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Online since:

September 2013

Authors:

Zhi Ying Ren, Cheng Hui Gao, Jian Xing Lin, Ding Shen

Keywords:

Dual-Tree Complex Wavelet, Nanometer Roughness, Three Dimensional Datum

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References

[1] NELSON C, PALMATEER S C, FORTE A R, et al. Comparison of metrology methods for quantify -ing the line edge roughness of patterned features[J]. Vacuum Science and Technology B：Microelectronics and Nanometer Structures, 1999, 17：2488-2498.

DOI: 10.1116/1.591117

Google Scholar

[2] ORJI N G, VORBURGER T V, FU J, et al. Line edge roughness metrology using atomic force microscopes[J]. Meas. Sci. Technol. 2005, 16(11)：2147-2154.

DOI: 10.1088/0957-0233/16/11/004

Google Scholar

[3] Hong-BoLi, ZhaoXueZeng, ChuWeietc. Semicondu-ctor industry critical dimension line edge roughness measuring [J]. Journal of Harbin industrial university, 2005, 33 (5) : 674-678.

Google Scholar

[4] ISO4287-1997: Geometrical Product Specifications (GPS)-Surface texture : Profile method-Terms, definitions and surface texture parameters.

DOI: 10.3403/30398213u

Google Scholar

[5] Qinghu Chen, Shunian Yang, Zhu Li. Surface roughness evaluation by using wavelets analysis [J]. Precision Engineering. 1999: 209 –212.

DOI: 10.1016/s0141-6359(99)00013-6

Google Scholar

[6] N G Kingsbury. The dual-tree complex wavelet transform: a new efficient tool for image restoration and enhancement, Proc. European Signal Processing Conference, EUSIPCO 98, Rhodes, 1998: 319-322.

Google Scholar

[7] J F A Magarey, N G Kingsbury. Motion estimation using a complex-valued wavelet transform, IEEE Trans. on Signal Processing, 1998, 46(4): 1069-84.

DOI: 10.1109/78.668557

Google Scholar

[8] N. Kingsbury. Image processing with complex wavelets, Phil. Tran. R. Soc. Lond. A, 1999, 357: 2543-2560.

Google Scholar

[9] N. Kingsbury, Complex wavelets for shift invariant analysis and filtering of signals, Appli. Comput. Harmon. Anal., 2001, 10(3): 234-253.

DOI: 10.1006/acha.2000.0343

Google Scholar

[10] IW Selesnick, RG Baraniuk，N. Kingsbury. The dual-tree complex wavelet transform. IEEE signal processing magazine [J]. 2005, 11: 123-151.

DOI: 10.1109/msp.2005.1550194

Google Scholar