Research on Feature Based IC Process Modeling and Clustering

Jin Feng Feng; Jin Ma; Jie Hu; Ying Hong Peng

doi:10.4028/www.scientific.net/AMM.397-400.2391

Paper Titles

Applying MPC08SP Motion Control Card to the Development of Open CNC System of Grooving Machines
p.2375

Research and Application of Music Digitalization Based on MATLAB
p.2379

Integration of Systematic RBAC Security Model and UML Model
p.2383

Research on the Digital Earth Based on OpenGL
p.2387

Research on Feature Based IC Process Modeling and Clustering
p.2391

Optimal Route Retrieval Model Based on Assignment Strategy
p.2398

U Nong Shu Cai Tong System - The Agricultural Expert System Based on U Disk
p.2406

The Construction of Psychology Lessons Planning Platform Based on the SSH
p.2415

A Simple Three-Dimensional Terrain Modeling Method for Complex Terrain Wind Environment Simulation
p.2420

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 397-400Research on Feature Based IC Process Modeling and...

Research on Feature Based IC Process Modeling and Clustering

Abstract:

In order to make effective reuse of existing integrated circuit (IC) process cases, improve design efficiency, robustness of design resolutions and overcome knowledge famine and knowledge orientation problems in design process, a feature based hierarchical framework of knowledge modeling and similarity measurements based knowledge clustering method of IC process cases are proposed. In this paper, IC process cases knowledge is represented into four types: sequential type, textual type, crisp type and interval type. According to knowledge classification, sequential similarity measurement for process sequence knowledge and content similarity measurement for the rest types are listed. Finally, existing IC wafer handling process cases of an IC manufacturing enterprise are employed to verify the proposed methods.

You might also be interested in these eBooks

Advanced Design and Manufacturing Technology III

View Preview

Info:

Periodical:

Applied Mechanics and Materials (Volumes 397-400)

Pages:

2391-2397

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.397-400.2391

Citation:

Cite this paper

Online since:

September 2013

Authors:

Jin Feng Feng, Jin Ma, Jie Hu, Ying Hong Peng

Keywords:

IC Process, Knowledge Clustering, Knowledge Modeling, Similarity Measurements

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] C. Liu, J.B. Wang. Systematic modeling method for manufacturing knowledge of process domain [J]. Computer Integrated Manufacturing System, 15 (2009)1500-1506.

Google Scholar

[2] G. Li, F.Y. Song, X.H. Chen. Research on development of process rule knowledge management system [J]. Microcomputer Applications, 24 (2008)33-35.

Google Scholar

[3] Y.L. Zhang, Q.W. Wang, M.Z. Guo. Research on process based knowledge modeling [J]. Manufacturing Information Engineering of China, 39 (2010)1-4.

Google Scholar

[4] W.G. Chen. Research on intelligent design technology for the manufacture process of HB-LED chip [D]. Guang Dong: Guangdong University of Technology, (2006).

Google Scholar

[5] S.L. Xie, Q. Huang, L.F. Lin, J.X. Dong. Case based intelligent process planning system [J]. Application Research of Computers, 19 (2002)97-99.

Google Scholar

[6] M.Y. Guo. Comparing Similarity Calculation Methods in Conversational CBR[J], Proceedings of the 2005 IEEE International Conference on Information Reuse and Integration, (2005)427-432.

DOI: 10.1109/iri-05.2005.1506511

Google Scholar

[7] I. Watson, S. Perera. A hierarchical case representation using context guided retrieval [J]．Knowledge Based Systems, 11 (1998)285-292.

DOI: 10.1016/s0950-7051(98)00068-9

Google Scholar