Adaptive Radio Frequency (RF) Identification Based on Frequency Domain Analysis for Open Non-Gaussian Background Environment

Abstract:

With the development of electronic technology, electronic equipments are suffering more electromagnetic interferences, so it is necessary to detect and evaluate their electromagnetic interference degree. The most commonly used method is the anechoic chamber test method that conducted in closed electromagnetic wave environment. However, there are some disadvantages, such as low detection efficiency and high testing cost. In order to avoid these advantages, a new method based on frequency domain analysis is presented to adaptively identify RF band of a detected device working in a non-Gaussian background environment. In this method, a non-parametric hypothesis testing is used to solve the interference of background noise on the detection result in an open environment. Further, an adaptive threshold hypothesis test method is also used to obtain the radio frequency spectrum of the detected signals for low SNR in order to overcome the frequency domain time-varying characteristics. The simulations show that the adaptive RF identification based on frequency domain analysis can improve the detection accuracy in the non-Gaussian background environment.

• Periodical: Applied Mechanics and Materials (Volumes 411-414)
• Pages: 1143-1147
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.411-414.1143
• Online since: September 2013
• Authors: Hong Quan Qu, Jie Yang, Hong Bin Qu
• Keywords: Adaptive Identification, Electromagnetic Compatibility (EMC), Frequency Domain Analysis, Non-Gaussian Background Environment, Non-Parametric Test

References

[1] J. Chen, J. Liu, J. Tian. Present situation and development of automated EMI testing System. Ordnance Industry Automation Vol 12 (2008): 57~60.

[2] S. Chen, W. Ma, X. Ma. in: EMC testing technology. Beijing: Beijing University of Posts and Telecommunications Press (2001).

[3] R. Cao, Z. Liang, H. Lu. The 3msemi-anechoic chamber and EMI testing system. Shanghai Measurement and Testing Vol 1 (2006): 10~12.

[4] J. Fu, F. Jiang, Z. Liang. Discussion on key technology of building up EMC laboratory. Electronics Quality Vol 8 (2003): 21~22.

[5] F. Gang, W. Wei, D. Pommerenke, F. Jun. Time synchronized near-field and far-field for EMI source identification. In IEEE international symposium on electromagnetic compatibility (2008): 1~2.

DOI: 10.1109/isemc.2008.4652142