The Response of Electrostatic MEMS Structure under Mechanical Shock and Electrostatic Forces

Xiang Guang Li; Qin Wen Huang; Yun Hui Wang; Yu Bin Jia; Zhi Bin Wang

doi:10.4028/www.scientific.net/AMM.427-429.120

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 427-429The Response of Electrostatic MEMS Structure under...

The Response of Electrostatic MEMS Structure under Mechanical Shock and Electrostatic Forces

Abstract:

For MEMS devices actuated by electrostatic force, unexpected failure modes can be hardly predicted when the electrostatic force coupled with the shock. A response model is established when a micro cantilever subjected to electrostatic force and mechanical shock. First, based on the theory of transverse forced vibration in vibration mechanics, the equation of motion under shock and electrostatic fore is presented. Then the reduced order model is gained after simplifying by mode superposition method. The computing results indicate that: the shock amplitude and duration are the key factors to affect the reliability of the device; the shock load and electrostatic forces make the threshold voltage much lower than the anticipated value. The micro cantilever may collapse to the substrate even at a voltage far lower than the pull-in voltage. This early dynamic pull-in instability may cause some failures such as short circuit, adhesion or collision damage.

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Periodical:

Applied Mechanics and Materials (Volumes 427-429)

Pages:

120-123

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.427-429.120

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Online since:

September 2013

Authors:

Xiang Guang Li, Qin Wen Huang, Yun Hui Wang, Yu Bin Jia, Zhi Bin Wang

Keywords:

Electrostatic Force, Failure, Mechanical Shock, Micro Cantilever, Pull-In Voltage

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