Mechanism of Parameters Variation about Electronic Components Subjected to High Impact Loads

Abstract:

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Large quantity dynamic testing experiments are carried out to testing the parameter of electronic components in high over loading impact condition with a standard hammer machine and a high speed data collection system. And the experiments were performed for about 5000 times to more than 30 types of resistors, capacitors, transistors to test their main parameter in different stress level and fixing mode. The parameter of some electronic components appears more or less unstable, namely temporary failure, and it is sensitive to different stress level and impact direct in experiments, which can offer important value of references for reliability lifespan.

Info:

Periodical:

Edited by:

Ran Chen

Pages:

256-259

DOI:

10.4028/www.scientific.net/AMM.44-47.256

Citation:

B. Li et al., "Mechanism of Parameters Variation about Electronic Components Subjected to High Impact Loads", Applied Mechanics and Materials, Vols. 44-47, pp. 256-259, 2011

Online since:

December 2010

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Price:

$35.00

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