Analysis of PCB via for Signal Integrity Using ANOVA

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This paper based on ANOVA (ANalysis Of VAriance) presents an investigation in the design of signal via in multilayered printed circuit boards (PCB) technology from a signal integrity point of view. Using the concept of the orthogonal array (OA), different vias physical aspect ratios have been set in the analysis. The impacts of these parameters are investigated with the help for a full-wave electromagnetic simulation soft HFSS. This study demonstrates the factors which is the most influence on the signal integrity.

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956-960

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November 2013

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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[1] Interconnect Signal Integrity Handbook, by Samtec, Inc. Aug. (2007).

Google Scholar

[2] Richard, Weng Yew Chang; See, Kye Yak; Chua, Eng Kee, Comprehensive Analysis of the Impact of via Design on High-Speed Signal Integrity, Electronics Packaging Technology Conference, 2007, pp.262-266, 10-12 Dec. (2007).

DOI: 10.1109/eptc.2007.4469746

Google Scholar

[3] Sammy G. Shina, Six Sigma for Electonics Design and Manufacturing, Professional Engineering Series, McGraw-Hill, (2002).

Google Scholar

[4] A. S. Hedayat, N. J. A. Sloane, and John Stufken, Orthogonal Arrays: Theory and Applications, Springer-Verlag New York Inc., New York, (1999).

Google Scholar

[5] Madhav Phadke, Quality Engineering using Robust Design, Pearson Education, (2008).

Google Scholar

[6] Taguchi, G., Chowdhury S., Wu Y.: Taguchi's Quality Engineering Handbook. Wiley. 2005. ISBN 0-471-41334-8.

Google Scholar

[7] URL : http: /www. weibull. com/DOEWeb/appendixc. htm, accessed on 20 April (2009).

Google Scholar

[8] Fauziyah Salehuddin, Ibrahim Ahmad, Fazrena Azlee Hamid and Azami Zaharim, Application of Taguchi Method in Optimization of Gate Oxide and Silicide Thickness for 45nm NMOS Device, International Journal of Engineering & Technology IJET Vol. 9, No. 10.

DOI: 10.1109/smelec.2010.5549488

Google Scholar

[9] Enrique del Castillo; Process optimization : A Statistical Approach, Springer, (2007).

Google Scholar

[10] D. R. Cox and N. Reid, The Theory of the Design of Experiments, Chapmanb & Hall/CRC, (2000).

Google Scholar