Evolution of Fault Self-Repairing Circuit with High Reliability

Jian An Lou; Yang Li; Jian Hua Yu

doi:10.4028/www.scientific.net/AMM.462-463.654

Paper Titles

The Multiport Analysis of Microstrip Circuits Using Gaussian Green’s Function Method
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Wireless Network Video Collection and Transmission Based on ARM
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Design of a Digital Audio Player Based on μc/Os and μc/GUI
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Evolution of Fault Self-Repairing Circuit with High Reliability
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Development of a Soft Starter with Current-Limiting, Reactive Power Compensation and Harmonic Filtering
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The Design of Electric System Faulty Phase Selection Device Based on DSP
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The Application of PLT-22 in the Intelligent Local Controller
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Intelligent and Compositive Protector for Motor Based on AVR Single-Chip Microcomputer
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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 462-463Evolution of Fault Self-Repairing Circuit with...

Evolution of Fault Self-Repairing Circuit with High Reliability

Abstract:

With the continuous improvement of the complexity of the microelectronic system, its reliability risk is becoming more and more obvious. In order to improve the reliability of electronic systems in complex electromagnetic environment, this paper proposes a new fault self-repairing method; the idea is to realize controllable silicon evolution on the FPGA. A MicroBlaze CPU and VRC array are designed, and the CPU runs the evolutionary algorithm to configure the VRC array, dynamically changing the structure and function of the circuit, so as to obtain high reliability of the digital fault self-repairing circuit. Evolving fault self-repairing technology provides a new way for the high reliability of the digital system design.

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Periodical:

Applied Mechanics and Materials (Volumes 462-463)

Pages:

654-657

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.462-463.654

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Online since:

November 2013

Authors:

Jian An Lou, Yang Li*, Jian Hua Yu

Keywords:

Digital Circuit, Evolvable Hardware, FPGA, High Reliability

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* - Corresponding Author

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