DOM Products: Activation Energy Estimation and Reliability Assessment

Abstract:

A scientific approach is proposed in this research to investigate a disk on module (DOM) product's activation energy based on experimental data that eliminates subjective experience. This study considers multiple temperature conditions to enhance the accuracy of activation energy estimation. In order to ensure the consistency of failure mode in each temperature scenario, the slopes of Weibul probability plots obtained from the failure data are calculated followed by an examination for parallelism. The estimated life time under normal service condition differs from the results obtained using the industrial standard given activation energy by approximately 42%.

• Periodical: Applied Mechanics and Materials (Volume 470)
• Pages: 781-784
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.470.781
• Online since: December 2013
• Authors: Chien Yi Huang, Yueh Hsun Lin*, Eric Huang
• Keywords: Activation Energy, Arrhenius Model, Disk on Module, Reliability Validation

References

[1] C.Y. Huang and H.H. Huang: Comparison of results from empirical ALT test to CAE simulation for wireless clients. Microelectronics International 2011; 28(3): 51–59.

DOI: 10.1108/13565361111162639

[2] J.R. Yoon and K.M. Lee: Analysis the reliability of multilayer ceramic capacitor with inner Ni electrode under highly accelerated life test conditions. Transactions on Electrical and Electronic Materials 2009; 10(1): 5–8.

DOI: 10.4313/teem.2009.10.1.005

[3] C.Y. Huang: The reliability assessment of flip chip component. Microelectronics International 2004; 21(2): 10–15.

[4] E. Nogueira, M. Vazquez and N. Nunez: Evaluation of AlGaInP LEDs reliability based on accelerated tests. Microelectronics Reliability 2009; 49: 1240–1243.

DOI: 10.1016/j.microrel.2009.06.031

[5] BlueEyes Corporation white paper, http: \www. BlueEyes. com. tw.