Study of Micro Vibration Measurement Using the Model of STM

Article Preview

Abstract:

Scanning tunneling microscopy is one of the surface measurement instruments in nanotechnology field, and the vertical resolution is about 0.01nm. So it is easily affected by the external micro vibration, conversely, we can measure the micro vibration using the working principle of STM. As we all know, the tunneling effect is the negative index relation between the tunneling current and the tunneling gap. On the other hand, the vibration measurement results can be used to offer the foundation in order to reduce the influence of micro random vibration for STM, it is necessary to measure the external vibration to compensate the experiment results of scanning tunneling microscoy. So the experimental device is developed and experiment of vibration detection is made. The experiment results show that results have high sensitivity, good frequency characteristic and the same vibratory response characteristic consistent with scanning tunneling microscopy.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

103-106

Citation:

Online since:

December 2013

Authors:

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] D. W. Pohl, Some design criteria in scanning tunneling microscopy, , IBM J. Res. Develop., vol. 30, pp.417-427, (1986).

DOI: 10.1147/rd.304.0417

Google Scholar

[2] Bai Chunli, Scanning Tunneling Micro-technology and Application. Shanghai: Shanghai Science and Technology Press, (1992).

Google Scholar

[3] LIU C H, Kenny T W, A high-precision, width-bandwidth micro machined tuneling accelerometer, Journal of Microeletromechanical System, vol. 10, pp.425-433, (2001).

Google Scholar

[4] J. Hoffmann and A. Weckenmann, Traceable profilometry with a 3D Nanopositioning Unit and zero indicating Sensors in compensation method, 7th International Symposium on Measurement Technology and Intelligent Instruments, pp.228-231, (2005).

DOI: 10.1088/1742-6596/13/1/053

Google Scholar

[5] Gaoliang Dai, Lena Jung, Frank Pohlenz, Measurement of micro-roughness using a metrological large range scanning force microscope, Measurement Science and Technology, vol. 15, pp.2039-2046, (2004).

DOI: 10.1088/0957-0233/15/10/013

Google Scholar

[6] H. K. Wickramasinghe, Progress in scanning probe microscopy, Acta Mater., 2000, 48: 347-358.

Google Scholar

[7] J. Hoffmann and A. Weckenmann, Traceable profilometry with a 3D Nanopositioning Unit and zero indicating Sensors in compensation method, 7th International Symposium on Measurement Technology and Intelligent Instruments, 2005, 228-231.

DOI: 10.1088/1742-6596/13/1/053

Google Scholar