Detection of early Defects of Apple Based on the Image Fusion

Jian Min Zhou; Hong Yan Yin

doi:10.4028/www.scientific.net/AMM.475-476.361

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 475-476Detection of early Defects of Apple Based on the...

Detection of early Defects of Apple Based on the Image Fusion

Abstract:

A new detecting method for apples’ early defects which was based on the image fusion of infrared and visible images was introduced in order to distinguish and separate the fruits with mechanical damage. Using apple as the research object, the basic detecting process was expounded, and the process of image registration was introduced emphatically. An improved algorithm of image fusion, which was based on wavelet transform, was proposed. Then the experimental result was provided as well as the objective evaluation for it.

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Periodical:

Applied Mechanics and Materials (Volumes 475-476)

Pages:

361-365

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.475-476.361

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Online since:

December 2013

Authors:

Jian Min Zhou*, Hong Yan Yin

Keywords:

Early Defect, Image Fusion, Infrared Thermography, Wavelet Transform (WT)

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* - Corresponding Author

References

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DOI: 10.1145/146370.146374

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