Research on Source of Infrared Light Stress with Wide View Field

Dong Lin Yang; Qing Liang Zeng

doi:10.4028/www.scientific.net/AMM.488-489.1001

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 488-489Research on Source of Infrared Light Stress with...

Research on Source of Infrared Light Stress with Wide View Field

Abstract:

Aiming at full view field control problems of infrared thermal imager during Light stress reliability test,this paper designs a standard light source with wide view filed, makes infrared target and background achieve a quantitative and standardized output and provides an important basis for reliability test of infrared thermal imager,it is a kind of indemnification for improving the quality of thermal imager. In this paper, the background of light stress blackbody and the target of infrared target is designed to provide a standard light stress source for test, the design of parallel light pipe can provide a wide view field. Application of digital image processing technology achieves automatic monitoring during test and computer can control output on light stress background and target according to needs ,so this system is automated from image acquisition to data processing.

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Periodical:

Applied Mechanics and Materials (Volumes 488-489)

Pages:

1001-1005

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.488-489.1001

Citation:

Cite this paper

Online since:

January 2014

Authors:

Dong Lin Yang*, Qing Liang Zeng

Keywords:

Automatic Monitoring, Infrared Thermal Imager, Light Source with Wide View Filed, Light Stress

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* - Corresponding Author

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