Research on Low-Temperature Reliability of Electrical Connectors

Abstract:

This paper mainly studies the effects of low temperature on the reliability of electrical connectors. Based on the theory of constant stress accelerated life test, this paper provides a kind of scheme of low temperature reliability test, which includes magnitude of the temperature stresses, the parameters measured during the test and so on. The detecting circuit is designed; the test is carried out and finally, according to the experimental data, it can be concluded that 1) both the absolute change and the relative change of contact resistance are small for each temperature stress; 2) the forecast data show a tendency toward slightly lower value of contact resistance for each low temperature stress; 3) the lower the test temperature stress, the smaller the value of contact resistance, but the difference in contact resistance is tiny; 4) stress analysis of samples under low temperature is also helpful for correctly evaluating the effects of low temperature on the reliability of electrical connectors.

• Periodical: Applied Mechanics and Materials (Volume 492)
• Pages: 190-194
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.492.190
• Online since: January 2014
• Authors: Yan Yan Luo, Yi Jun Wang, Lei Liu, Xin Wei Liu, Zhen Ping Ma, Zhen Wang, Shu Mei Zheng
• Keywords: Contact Resistance, Electrical Connectors, Low Temperature, Reliability

References

[1] Ming Sun, Qiping Wang. Transactions of China Electrotechnical Society, Vol. 4 (1990) No. 1, p.34. (In Chinese).

[2] Kaiping Zhang. Failure mechanism analysis on the large-scale low temperature simulate environment test system (MS., Nanjing University of Science and Technology, China 2005). (In Chinese).

[3] Shisong Mao. Practice and Experience, Vol. 103 (2003) No. 1, p.8. (In Chinese).

[4] L.D. Kazmina, S.M. Tsoi. Soviet surface engineering and applied electrochemistry. (1989) No. 6, p.102.

[5] Mike Silverman. Proc. the 44th Annual Technical Meeting ( Phoenix, AZ, USA, April 26 - May 1, 1998). Vol. 1. p.283.

[6] Nelson,W. Accelerated Testing: Statistical Models, Test Plans and Data Analyses (John Wiley & Sons Inc., US, 1990).

[7] Jinwu Zhuo. The Application of MATLAB in Mathematical Modeling (Beijing University of Aeronautics and Astronautics Press , China, 2011). (In Chinese).