Concurrent Core Test Based on Partial Test Set Reusing

Xi Lei Huang; Mao Xiang Yi; Lin Wang; Hua Guo Liang

doi:10.4028/www.scientific.net/AMM.529.359

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 529Concurrent Core Test Based on Partial Test Set...

Concurrent Core Test Based on Partial Test Set Reusing

Abstract:

A novel concurrent core test approach is proposed to reduce the test cost of SoC. Before test, a novel test set sharing strategy is proposed to obtain a minimum size of merged test set by merging the test sets corresponding to cores under test (CUT).Moreover, it can be used in conjunction with general compression/decompression techniques to further reduce test data volume (TDV). During test, the proposed vector separating device which is composed of a set of simple combinational logical circuit (CLC) is designed for separating the vector from the merged test set to the correspondent test core. This approach does not add any test vector for each core and can test synchronously to reduce test application time (TAT). Experimental results for ISCAS’ 89 benchmarks have been rproven the efficiency of the proposed approach.

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Periodical:

Applied Mechanics and Materials (Volume 529)

Pages:

359-363

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.529.359

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Online since:

June 2014

Authors:

Xi Lei Huang*, Mao Xiang Yi, Lin Wang, Hua Guo Liang

Keywords:

Compression, Concurrentcore Test, Partialtest Set Reusing, Vector Separating Device

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