[1]
R. Autrata, P. Schauer, J. Kvapil, et al.: J. Phys. E, Sci. Instrum. 11(1978), p.707.
Google Scholar
[2]
M. Moszynski, T. Ludziewski, D. Wolski, et al.: Nucl. Instrum. Methods Phys. Res. A 345 (1994), p.461.
Google Scholar
[3]
A. Lempicki, M. H. Randles, D. Wisniewski, et al.: IEEE Trans. Nucl. Sci. 42(1995), p.280.
Google Scholar
[4]
M. Nikl, E. Mihokova, J. A. Mares, et al.: Phys. Status Solidi B 181 (2000), p. R10.
Google Scholar
[5]
H. Ogino, A. Yoshikawa, M. Nikl, et al.: Cryst. Growth 311 (2009), p.908.
Google Scholar
[6]
P. Dorenbos: IEEE Trans. Nucl. Sci. 57 (2010), p.1162.
Google Scholar
[7]
M. Nikl, A. Vedda, M. Fasoli, et al.: Phys. Rev. B 76 (2007), p.195121.
Google Scholar
[8]
W. Chewpraditkul, L. Swiderski, et al.: IEEE Trans. Nucl. Sci. 56 (2009), p.3800.
Google Scholar
[9]
J. A. Mares, A. Beitlerova, M. Nikl, et al.: Rad. Meas. 38 (2004), p.353.
Google Scholar
[10]
C. Dujardin, C. Mancini, D. Amans, et al.: J. Appl. Phys. 108 (2010), p.013510.
Google Scholar
[11]
M. Nikl, J. Pejchal, E. Mihokova, et al.: Appl. Phys. Lett. 88 (2006), p.141916.
Google Scholar
[12]
M. Fasoli, A. Vedda, M. Nikl, et al.: Phys. Rev. B 84 (2011), p.081102(R).
Google Scholar
[13]
E. van der Kolk, S. A. Basun, G. F. Imbush, et al.: Appl. Phys. Lett. 83 (2003), p.1740.
Google Scholar
[14]
N. J. Cherepy, J. D. Kuntz, Z. M. Seeley, et al.: Proc. SPIE 7805, No. 78050I (2010).
Google Scholar
[15]
K. Kamada, T. Endo, K. Tsutsumi, et al.: Cryst. Growth Des. 11 (2011), p.4484.
Google Scholar
[16]
K. Kamada, T. Yanagida, J. Pejchal, et al.: J. Phys. D: Appl. Phys. 44 (2011), p.505104.
Google Scholar
[17]
P. Dorenbos: J. Lumin. 134 (2013), p.310.
Google Scholar
[18]
J. M. Ogiegło, A. Katelnikovas, A. Zych, et al.: J. Phys. Chemistry A 117 (2013), p.2479.
Google Scholar
[19]
J. Ueda, K. Aishima, S. Tanabe: Optical Materials 35 (2013), p. (1952).
Google Scholar
[20]
Y. Wu and G. Ren: Optical Materials 35 (2013), p.2146.
Google Scholar
[21]
M. Nikl, A. Yoshikawa, K. Kamada, et al.: Progr. Cryst. Growth Charact. Materials 59 (2013), p.47.
Google Scholar
[22]
O. Sidletskiy, V. Kononets, K. Lebbou, et al.: Mat. Res. Bull. 47 (2012), p.3249.
Google Scholar
[23]
M. Moszynski, M. Kapusta, M. Mayhugh, et al.: IEEE Trans. Nucl. Sci. 44 (1997), p.1052.
Google Scholar
[24]
M. Bertolaccini, S. Cova and C. Bussolatti, in: Proceeding of Nuclear Electronics Symposium, Versailles, France (1968).
Google Scholar
[25]
M. Kucera, M. Nikl, M. Hanus, et al.: Phys. Status Solidi RRL 7 (2013), p.571.
Google Scholar
[26]
V. Babin, M. Nikl, K. Kamada, et al.: J. Phys. D: Applied Phys. 46 (2013), p.365303.
Google Scholar
[27]
Y. Pan, M. Wu and Q. Su: J. Phys. Chem. Solids 65 (2004), p.845.
Google Scholar
[28]
W. W. Holloway and M. J. Kestigian: Opt. Soc. Am. 59 (1969), p.60.
Google Scholar
[29]
J. M. Robertson, M. W. van Tol, W. H. Smits, et al.: Philips J. Res. 36 (1981), p.15.
Google Scholar
[30]
A. B. Muñoz-García and L. Seijo: Phys. Rev. B 82 (2010), p.184118.
Google Scholar