[1]
Z-C. Hong, H-C. Hsueh, S-T. Shiue, Characteristics of carbon-nickel nanocomposite thin films prepared by reactive sputtering under different radio frequency powers and their applications for electronic devices, Thin Solid Films, 653 (2018) 350-358.
DOI: 10.1016/j.tsf.2018.03.066
Google Scholar
[2]
Ş. Ţălu, C. Luna, A. Ahmadpourian, A. Achour, A. Arman, S. Naderi, N. Ghobadi, S. Stach, B. Safibonab, Micromorphology and fractal analysis of nickel–carbon composite thin films, J. Mater. Sci. Mater. Electron, 27(11) (2016) 11425–11431. DOI: 10.1007/ s10854-016-5268-9.
DOI: 10.1007/s10854-016-5268-9
Google Scholar
[3]
A. Adamiec, S. Stach, Ş. Ţălu, Quantitative investigations about the surface texture characteristics of the nickel-carbon composite thin films using stereometric analysis. Advances in Intelligent Systems Research, 153 (2017) 98-101.
DOI: 10.2991/amms-17.2017.22
Google Scholar
[4]
Ş. Ţălu, M. Bramowicz, S. Kulesza, V. Dalouji, S. Solaymani, S. Valedbagi, Fractal features of carbon–nickel composite thin films, Microsc. Res. Tech., 79(12) (2016) 1208-1213.
DOI: 10.1002/jemt.22779
Google Scholar
[5]
S. Ramazanov, Ş. Ţălu, D. Sobola, S. Stach, G. Ramazanov, Epitaxy of silicon carbide on silicon: Micromorphological analysis of growth surface evolution, Superlattices Microstruct., 86 (2015) 395-402.
DOI: 10.1515/msp-2017-0049
Google Scholar
[6]
S. Stach, W. Sapota, Ş. Ţălu, A. Ahmadpourian, C. Luna, N. Ghobadi, A. Arman, M. Ganji, 3D Surface stereometry studies of sputtered TiN thin films obtained at different substrate temperatures. J. Mater. Sci. Mater. Electron., 28(2) (2017) 2113-2122.
DOI: 10.1007/s10854-016-5774-9
Google Scholar
[7]
A. Arman, Ş. Ţălu, C. Luna, A. Ahmadpourian, M. Naseri, M. Molamohammadi, Micromorphology characterization of copper thin films by AFM and fractal analysis, J. Mater. Sci. Mater. Electron., 26 (2015) 9630–9639.
DOI: 10.1007/s10854-015-3628-5
Google Scholar
[8]
N. Naseri, S. Solaymani, A. Ghaderi, M. Bramowicz, S. Kulesza, Ş. Ţălu, M. Pourreza, S. Ghasemi, Microstructure, morphology and electrochemical properties of Co nanoflake water oxidation electrocatalyst at micro- and nanoscale. RSC Advances, 7(21) (2017) 12923-12930.
DOI: 10.1039/c6ra28795f
Google Scholar
[9]
Ş. Ţălu, A.J. Ghazai, S. Stach, H. Abu Hassan, Z. Hassan, M. Ţălu, Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis, J. Mater. Sci. Mater. Electron., 25(1) (2014) 466-477.
DOI: 10.1007/s10854-013-1611-6
Google Scholar
[10]
S. Stach, D. Dallaeva, Ş. Ţălu, P. Kaspar, P. Tománek, S. Giovanzana, L. Grmela, Morphological features in aluminum nitride epilayers prepared by magnetron sputtering, Mater. Sci. Poland, 33(1) (2015) 175-184.
DOI: 10.1515/msp-2015-0036
Google Scholar
[11]
Ş. Ţălu, Micro and nanoscale characterization of three dimensional surfaces. Basics and applications, Napoca Star Publishing House, Cluj-Napoca, Romania, (2015).
Google Scholar
[12]
T. Ghodselahi, A. Arman, Magnetoresistance of Cu–Ni nanoparticles in hydrogenated amorphous carbon thin films, J. Mater. Sci. Mater. Electron, 26(6) (2015) 4193–4197.
DOI: 10.1007/s10854-015-2965-8
Google Scholar
[13]
Ş. Ţălu, S. Stach, S. Valedbagi, S. M. Elahi, R. Bavadi, Surface morphology of titanium nitride thin films synthesised by DC reactive magnetron sputtering, Mater. Sci. Poland, 33(1) (2015) 137-143.
DOI: 10.1515/msp-2015-0010
Google Scholar
[14]
D. Elenkova, J. Zaharieva, M. Getsova, I. Manolov, M. Milanova, S. Stach, Ş. Ţălu, Morphology and Optical Properties of SiO2-Based Composite Thin Films with Immobilized Terbium(III) Complex with a Biscoumarin Derivative, Int. J. Polym. Anal. Charact., 20(1) (2015) 42-56.
DOI: 10.1080/1023666x.2014.955400
Google Scholar
[15]
Ş. Ţălu, S. Stach, J. Zaharieva, M. Milanova, D. Todorovsky, S. Giovanzana, Surface roughness characterization of poly(methylmethacrylate) films with immobi-lized Eu(III) β-Diketonates by fractal analysis. Int J Polym Anal Ch., 19 (2014) 1-18.
DOI: 10.1080/1023666x.2014.904149
Google Scholar
[16]
Ş. Ţălu, S. Stach, D. Raoufi, F. Hosseinpanahi, Film thickness efect on fractality of tin-doped In2O3 thin films, Electronic Materials Letters, 11(5) (2015) 749-757.
DOI: 10.1007/s13391-015-4280-1
Google Scholar
[17]
A. Ahmadpourian, C. Luna, A. Boochani, A. Arman, A. Achour, S. Rezaee, S. Naderi, The effects of deposition time on surface morphology, structural, electrical and optical properties of sputtered Ag-Cu thin films, The European Physical Journal Plus, 131(10) (2016) 381.
DOI: 10.1140/epjp/i2016-16381-2
Google Scholar
[18]
Ş. Ţălu, S. Solaymani, M. Bramowicz, S. Kulesza, A. Ghaderi, S. Shahpouri, S.M. Elahi, Effect of electric field direction and substrate roughness on three-dimensional self-assembly growth of copper oxide nanowires. J. Mater. Sci. Mater. Electron., 27(9) (2016) 9272-9277.
DOI: 10.1007/s10854-016-4965-8
Google Scholar
[19]
M. Molamohammadi, C. Luna, A. Arman, S. Solaymani, A. Boochani, A. Ahmadpourian, A. Shafiekhani, Preparation and magnetoresistance behavior of nickel nanoparticles embedded in hydrogenated carbon film, J. Mater. Sci. Mater. Electron, 26(9) (2015) 6814–6818.
DOI: 10.1007/s10854-015-3294-7
Google Scholar
[20]
B. Bayatsarmadi, Y. Zheng, V. Russo, L. Ge, C. S. S. Casari, S. Qiao, Highly active nickel–cobalt/nanocarbon thin films as efficient water splitting electrodes, Nanoscale, 8(43) (2016) 18507-18515.
DOI: 10.1039/c6nr06961d
Google Scholar
[21]
N. Bouts, M. Gaillard, L. Donero, A.A. El Mel, E. Gautron, B. Angleraud, C. Boulmer-Leborgne, P.Y. Tessier, Growth control of carbon nanotubes using nanocomposite nickel/carbon thin films, Thin Solid Films, 630 (2017) 38–47.
DOI: 10.1016/j.tsf.2016.10.025
Google Scholar
[22]
N. Bouts, B. Angleraud, M.D. Ynsa, B. Humbert, M. Manso, A.A. El Mel, P.Y. Tessier, Electrical behavior of nickel/carbon nanocomposite thin films, Carbon, 111 (2017) 878-886.
DOI: 10.1016/j.carbon.2016.10.053
Google Scholar
[23]
S. Stach, Ż. Garczyk, Ş. Ţălu, S. Solaymani, A. Ghaderi, R. Moradian, B. Nezafat Negin, S.M. Elahi, H. Gholamali, Stereometric parameters of the Cu/Fe NPs thin films, J. Phys. Chem. C, 119(31) (2015) 17887–17898.
DOI: 10.1021/acs.jpcc.5b04676
Google Scholar
[24]
D. Dallaeva, Ş. Ţălu, S. Stach, P. Škarvada, P. Tománek, L. Grmela, AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates, Appl. Surf. Sci., 312 (2014) 81-86. DOI: 10.1016/ j.apsusc.2014.05.086.
DOI: 10.1016/j.apsusc.2014.05.086
Google Scholar
[25]
Ş. Ţălu, S. Stach, S. Valedbagi, R. Bavadi, S. M. Elahi, M. Ţălu, Multifractal characteristics of titanium nitride thin films. Materials Science-Poland, 33(3) (2015) 541-548.
DOI: 10.1515/msp-2015-0086
Google Scholar
[26]
Ş. Ţălu, I.A. Morozov, R.P. Yadav, Multifractal analysis of sputtered indium tin oxide thin film surfaces. Appl Surf Sci., 484 (2019) 892-898.
DOI: 10.1016/j.apsusc.2019.04.170
Google Scholar
[27]
MountainsMap® 7 Software (Digital Surf, Besançon, France). Information on http://www.digitalsurf.fr (last accessed October 10th, 2019).
Google Scholar
[28]
ISO 25178-2: 2012, Geometrical product specifications (GPS) - Surface texture: Areal - Part 2: Terms, definitions and surface texture parameters. Information on http://www.iso.org.
DOI: 10.3403/30154352u
Google Scholar