Removal of Ion Irradiation-Induced Affected Layers from Diamond Cutting Tools to Improve Machining Performance

Noritaka Kawasegi; Kazuma Ozaki; Noboru Morita; Kazuhito Nishimura; Hideki Sasaoka

doi:10.4028/www.scientific.net/AMR.1017.479

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1017Removal of Ion Irradiation-Induced Affected Layers...

Removal of Ion Irradiation-Induced Affected Layers from Diamond Cutting Tools to Improve Machining Performance

Abstract:

A focused ion beam (FIB) is an effective means of fabricating micro-to submicro-scale shapes on diamond cutting tools. However, ion irradiation of diamond tools causes ion implantation, defects, and non-diamond phases, all of which degrade the tool performance. To remove affected layers from FIB-irradiated diamond tools, heat treatment in air was applied, and the effect of the heating parameters on the etchability of the irradiated area was investigated. It was found that the affected layer could be etched and removed from the diamond tool surface, even at 500 °C. In machining experiments on aluminum alloy and nickel phosphorus, machining performance was improved by the applied heating technique, and the cutting forces and machined surfaces were similar to those obtained with the non-irradiated tool. These results indicate that the proposed heating technique is effective for diamond cutting tools shaped by FIB.

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Periodical:

Advanced Materials Research (Volume 1017)

Pages:

479-484

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1017.479

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Online since:

September 2014

Authors:

Noritaka Kawasegi*, Kazuma Ozaki, Noboru Morita, Kazuhito Nishimura, Hideki Sasaoka

Keywords:

Aluminium Alloy, Focused Ion Beam, Gallium, Heat Treatment, Nickel Phosphorus, Non-Diamond Phase, Single-Crystal Diamond Tool, Ultra-Precision Machining

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