A Kind of Resistance Capacitance Measurement Method Based on Time Constant

Xuan Ze Wang; Xu Qing Mo; Liang En Yang; Zhong Sheng Zhai; Wen Chao Liu; Zhi Xiong

doi:10.4028/www.scientific.net/AMR.1037.156

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1037A Kind of Resistance Capacitance Measurement...

A Kind of Resistance Capacitance Measurement Method Based on Time Constant

Abstract:

This paper proposes a capacitance resistance measurement method based on time constant. Using the charging and discharging characteristics of the resistance and capacitance measures the value of the resistance and capacitance through a semi potential rise and fall time measurement. Theoretical analysis of the relationship between the value of the resistance and capacitance and the measuring time, designing the fast second charging and discharging method meeting the initial condition of charge and discharge, improving the measurement speed, expanding the measurement range of the resistance and capacitance. Realizing the effective measurement of the resistance and capacitance by the FPGA control logic and timing method.

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Periodical:

Advanced Materials Research (Volume 1037)

Pages:

156-160

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1037.156

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Online since:

October 2014

Authors:

Xuan Ze Wang*, Xu Qing Mo, Liang En Yang, Zhong Sheng Zhai, Wen Chao Liu, Zhi Xiong

Keywords:

Discharge, FPGA, Measurement of the Capacitors, Resistors, Second Charge

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* - Corresponding Author

References

[1] AHOLA R, MYLLYLA R. A new method for measuring the time-of-flight in fast laser range finding[J]. Proc. SPIE, 1986(654): 19-25.

DOI: 10.1117/12.938263

Google Scholar

[2] GORBICS M, ROBERTS S K, ROBERTS K M, A high resolution multihit time to digital converter integrated circuit[J]. IEEE Transactions on Nuclear Science. 1997, 44(3): 379-384.

DOI: 10.1109/23.603675

Google Scholar

[3] RAISANEN-RUOTSALAINEN E, RAHKONEN T, KOST AMOVAARA J. Time interval measurements using time-to-voltage conversion with built-in dual-slope A/D conversion[C]. Proc. IEEE Symp. Circuits Syst, 1991: 2573-2576.

DOI: 10.1109/iscas.1991.176053

Google Scholar

[4] Spartan-3 Generation FPGA User Guide[Z]. Xilinx Inc. UG331. August 19, (2010).

Google Scholar

[5] Lo, Jien-Chung. On-chip Short-time Interval Measurement System for High-speed Signal Timing Characterization[J]. Journal of System Architecture, 2005, 51(4): 265-276.

DOI: 10.1016/j.sysarc.2004.11.004

Google Scholar