Design on Monitoring and Management System of Large-Scale Instrument and Expensive Equipment Based on STC MCU

Guan Li; Xian Guo Liu; Xiang Li Bu; Hui Jun Wang

doi:10.4028/www.scientific.net/AMR.1044-1045.1710

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 1044-1045Design on Monitoring and Management System of...

Design on Monitoring and Management System of Large-Scale Instrument and Expensive Equipment Based on STC MCU

Abstract:

To resolve the problems of large-scale instruments and expensive equipment with low utilization and difficult to unified management in colleges and universities, remote monitoring system is designed based on STC microcontroller, RFID and remote monitoring technology. Field controller hardware circuit was designed and control programs were developed. Identity collecting, user authorization, data acquisition of using process and other functions were realized. Data was transferred by campus LAN or GPRS communication module. User management remote monitoring, data statistics, print statements and other functions were developed in PC. Device information is collected in real time. The unified management of large-scale instruments and expensive equipment was accomplished.

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Periodical:

Advanced Materials Research (Volumes 1044-1045)

Pages:

1710-1714

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1044-1045.1710

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Online since:

October 2014

Authors:

Guan Li*, Xian Guo Liu, Xiang Li Bu, Hui Jun Wang

Keywords:

Expensive Equipment, Large-Scale Instruments, RFID, STC15F2K60S2

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* - Corresponding Author

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