A Silicon Semiconductor Temperature Sensor Applied for RFID Tag

Abstract:

A new type of silicon semiconductor temperature sensor applied for RFID tag chip is designed based on the linear temperature characteristic of base-emitter voltage of parasitic substrate PNP transistor. A novel switched capacitor integrator based on positive-negative synchronous integration is introduced to amplify the weak temperature signal precisely and provide a method to represent the temperature in analog domain. Temperature quantization is accomplished by a 12-bit ultra-low-power successive approximation analog-to-digital converter providing a resolution of 0.03125°C/LSB. The circuit was simulated by using device model of 0.18-μm CMOS process. The output integration swing is 2VPP and the average current dissipation is 38.91μA at 1.8V supply. The sensor achieves an accuracy of -0.1°C to +0.33°C in the temperature range of -39°C to 89°C.

• Periodical: Advanced Materials Research (Volume 1082)
• Pages: 541-546
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.1082.541
• Online since: December 2014
• Authors: Hui Chen*, Wei Ping Jing, Shao Qing Huang
• Keywords: ADC, Parasitic Substrate PNP Transistor, RFID, Silicon Semiconductor Temperature Sensor, Switched-Capacitor Integrator

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