Control over Hard X-Ray Parameters Using External Temperature Gradient

Vahan Kocharian; Artak Mkrtchyan; Aleksey Gogolev; Sargis Khlopuzyan; Poghos Grigoryan

doi:10.4028/www.scientific.net/AMR.1084.107

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1084Control over Hard X-Ray Parameters Using External...

Control over Hard X-Ray Parameters Using External Temperature Gradient

Abstract:

In order to gain control over hard X-ray (over 30 keV), we have considered the X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient. It was experimentally proved that the intensity of the reflected beam can be increased up to 35 times if the X-ray energies are 30 keV and keV for reflecting atomic planes () depending on the value of the temperature gradient. As the temperature gradient increases, the focus moves closer to the crystal and the focal spot shrinks in the diffraction plane.

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Periodical:

Advanced Materials Research (Volume 1084)

Pages:

107-110

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1084.107

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Online since:

January 2015

Authors:

Vahan Kocharian, Artak Mkrtchyan, Aleksey Gogolev*, Sargis Khlopuzyan, Poghos Grigoryan

Keywords:

Diffraction, Temperature Gradient, X-Ray

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References

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