p.82
p.88
p.92
p.96
p.100
p.107
p.113
p.118
p.125
Residual Stress Measurement of Industrial Polymers by X-Ray Diffraction
Abstract:
In this study, residual stresses in polyamide (PA) materials were measured by the x-ray stress measurement technique. X-ray stress measurement is widely used to measure residual stresses, however, this measurement is not many used in polymeric materials. There are two problems for measuring residual stresses in polymer. Firstly, the diffraction peak from the polymer appears at the low 2θ angle region. Thus the measurement accuracy for strains reduces. Secondly, the low 2θ angle region is very difficult to use the sin2ψ method. In this study, Ω-diffractometer with transmission method was used to resolve these problems. The measured data was plotted in the d-sin2ψ diagram, and it was coincident with the linear regression line clearly. X-ray elastic constant (XEC) of PA was estimated from these results.
Info:
Periodical:
Pages:
100-103
Citation:
Online since:
June 2015
Authors:
Price:
Сopyright:
© 2015 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: