Using Simulated Data to Support the Calibration Process of ED-XRF Analysis

Abstract:

In the general practice of ED-XRF measurements, the values of elemental concentrations are derived from complicated calculation methods. Hereby a simple mathematical formula is suggested, which provides an easy way to prepare standard samples. On the other hand, the simulation of spectral lines may also be a helpful tool for the calibration process. In this study, measured and simulated data were used for the quantitative analysis of ternary Au-Ag-Cu alloys. To determine the calibration points, the peak intensity ratio method was applied and the calibration curves were fitted. This work presents the results of a twofold investigation aimed at: a) finding a suitable computational tool to optimise the parameters of the underlying equations and b) testing the reliability of the simulated data to determine the concentrations of multi-element standard samples. Based on comparisons of calculated concentrations it can be stated that a simple calculation method with simulated data provides an easy tool to define calibration standards. It is also demonstrated that the parameters of the linear plots can be optimised to yield improved results.

• Periodical: Advanced Materials Research (Volumes 1120-1121)
• Pages: 1435-1440
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.1120-1121.1435
• Online since: July 2015
• Authors: Dániel Koncz-Horváth*, Zoltán Gácsi
• Keywords: Energy Dispersive X-Ray Fluorescence, Genetic Algorithm, Intensity Ratios, Multi-Element Method, Spectrum Simulation

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