A Novel Empirical Mode Decomposition Denoising Scheme

Wei Du; Quan Liu

doi:10.4028/www.scientific.net/AMR.143-144.527

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Composition Identification of Typical Decorative Textiles in Tibetan Historical Buildings by Burning Test and Projection Microscope Test
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An Improved Algorithm for TSP Problem Solving with Hopfield Neural Networks
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Design of the Thermoelectric Generator
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Immune-Inspired Quantum Genetic Optimization Algorithm and its Application
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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 143-144A Novel Empirical Mode Decomposition Denoising...

A Novel Empirical Mode Decomposition Denoising Scheme

Abstract:

This paper presents a novel and fast scheme for signal denoising by using Empirical mode decomposition (EMD). The EMD involves the adaptive decomposition of signal into a series of oscillating components, Intrinsic mode functions(IMFs), by means of a decomposition process called sifting algorithm. The basic principle of the method is to reconstruct the signal with IMFs previously selected and thresholded. The denoising method is applied to four simulated signals with different noise levels and the results compared to Wavelets, EMD-Hard and EMD-Soft methods.