X-Ray Characterization and Crystal Structure of SBT Doped with V2O5

Su Hua Lv; Shu Lang Guo; Hua Ji

doi:10.4028/www.scientific.net/AMR.287-290.608

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 287-290X-Ray Characterization and Crystal Structure of...

X-Ray Characterization and Crystal Structure of SBT Doped with V₂O₅

Abstract:

SBT Ferroelectric Materials are prepared by solid reaction sintering process after doping V₂O₅to SBT bulk and its properties are researched. The results show that this method can decrease sintering temperature , change the grains from rod to plate shape, increase grains size and lead to the grains growth with c-axis. And there are ferroelectric 90b domains in SBTV crystal .

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Advanced Materials Research (Volumes 287-290)

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608-612

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.287-290.608

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Online since:

July 2011

Authors:

Su Hua Lv, Shu Lang Guo, Hua Ji

Keywords:

C-Axis, Ferroelectric 90b Domains, Grains Shape, Sintering Temperature

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