Electrochemical Characterization of Metal Oxynitride Thin Film as New Lithium Storage Materials

Abstract:

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Metal oxynitride (VxON, CrxON) thin film has been fabricated by reactive dc sputtering method and annealing process. Its electrochemical properties are investigated in a MxON/Li cell. The reversible specific capacities are around 830 mAh g-1 for VxON and 730 mAh g-1 for CrxON. By using selected-area electron diffraction and X-ray photoelectron spectroscopy measurements, New electrochemical reaction mechanism is uncovered, which should be responsible for its good electrochemical performance.

Info:

Periodical:

Advanced Materials Research (Volumes 295-297)

Edited by:

Pengcheng Wang, Liqun Ai, Yungang Li, Xiaoming Sang and Jinglong Bu

Pages:

912-916

DOI:

10.4028/www.scientific.net/AMR.295-297.912

Citation:

Y. N. Zhou and Z. W. Fu, "Electrochemical Characterization of Metal Oxynitride Thin Film as New Lithium Storage Materials", Advanced Materials Research, Vols. 295-297, pp. 912-916, 2011

Online since:

July 2011

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Price:

$35.00

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