A Test Method of CCD Photoelectric Parameters

Abstract:

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Until now, no effective method to measure CCD photoelectric parameters. To solve the problem, a novel measurement method that combines hardware with software is proposed, and it can let hardware and software collaborate with each other to finish assignment together. Firstly, the ideal relation between output voltage and input exposure quantity of CCD is given. Secondly, some main photoelectric parameters of CCD are elaborated. Then based on the principle, test system of CCD photoelectric parameters that combines hardware with software is designed. Lastly, the real relation between output voltage and input exposure quantity of CCD is given, and the test results of experiment of each photoelectric parameter are obtained according to the relation. What’s more, analysis and comparison of the results of the experiment are given in this paper. The method is reliable and the precision is high in the experiment.

Info:

Periodical:

Advanced Materials Research (Volumes 317-319)

Edited by:

Xin Chen

Pages:

1119-1122

DOI:

10.4028/www.scientific.net/AMR.317-319.1119

Citation:

N. S. Qiao et al., "A Test Method of CCD Photoelectric Parameters", Advanced Materials Research, Vols. 317-319, pp. 1119-1122, 2011

Online since:

August 2011

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Price:

$35.00

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