A Test Method of CCD Photoelectric Parameters

Abstract:

Until now, no effective method to measure CCD photoelectric parameters. To solve the problem, a novel measurement method that combines hardware with software is proposed, and it can let hardware and software collaborate with each other to finish assignment together. Firstly, the ideal relation between output voltage and input exposure quantity of CCD is given. Secondly, some main photoelectric parameters of CCD are elaborated. Then based on the principle, test system of CCD photoelectric parameters that combines hardware with software is designed. Lastly, the real relation between output voltage and input exposure quantity of CCD is given, and the test results of experiment of each photoelectric parameter are obtained according to the relation. What’s more, analysis and comparison of the results of the experiment are given in this paper. The method is reliable and the precision is high in the experiment.

• Periodical: Advanced Materials Research (Volumes 317-319)
• Pages: 1119-1122
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.317-319.1119
• Online since: August 2011
• Authors: Nao Sheng Qiao, Chun Mei Yao, Yan Li, Xue Juan Chen
• Keywords: CCD Photoelectric Parameters, CCD Test, Measurement Precision, Test System

References

[1] Heshun Wang, Cichang Chen and Weigong Huang: Journal of Optoelectronics Laser Vol. 83 (2010), p.63, In Chinese

[2] Jinlong Ma, Chang'an Liu and Wei Qiu: High Power Laser and Particle Beams Vol. 22 (2010), p.2023, In Chinese

[3] Dexin Zhang, Guangfu Ma and Guozhi Qu: Infrared and Laser Engineering Vol 39 (2010), p.1060, In Chinese

[4] Mingwei Li, Qian Zhang and Yongtao Wang: Chinese Journal of Electron Devices Vol 30 (2007), p.1332, In Chinese

[5] Peijian Ye, Fuan Liu and Haiyi Cao: Chinese space science and technology Vol 3 (1997), p.44, In Chinese

[6] Yi Dong, Fu Wang and Shoucheng Cheng: Journal of Ordnance Engineering College Vol 13 (2001) p.39, In Chinese

[7] J. Kutzner, L. Highyower and C. Pruitt: Smpte Journal Vol (1992), p.325

[8] Lijuan Li, Zhiyong An and Ruining Yang: Conference on Lasers and Electro-Optics/Pacific Rim Vol. 1 (2009) p.12

[9] Yi Lu, Zai Luo and Guiying Yu: SPIE Vol. 7133 (2009), p. 7133T/1

[10] Gao Wang, Xiaoyan Wang and M. Z. Islam: IEEE Vol. 1 (2009), p.263

[11] A. P. Jafar and G. Armin: ISPRS Journal of Photogrammetry and Remote Sensing Vol. 65 (2010), p.60