Application of Skin Detection Based on Irregular Polygon Area Boundary Constraint on YCbCr and Reverse Gamma Correction

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Abstract:

YCbCr color space is widely used in skin detection. An improved method is brought up in this paper: a method based on irregular polygon area boundary constraint on YCbCr color space. Experiments shows that this method get more accurate distribution of skin color in YCbCr color space and lower the false detection rate while keeps the precision rate. In consideration of that the value of pix on image is not the real pix in real life, an improved reverse Gamma correction is brought up for solve a problem in reverse Gamma correction. Experiment result shows that improved reverse Gamma correction is better than none improved reverse Gamma correction.

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31-36

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September 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] CHEN Duan-sheng, LIU Zheng-kai. A Survey of Skin Color Detection. Chinese Journal Of Computers. Vol 29(2006), p.194.

Google Scholar

[2] LIU Zheng, ZHU Chang-ren. An optimal color space description for skin detection. Computer Applications. Vol 26(2006), p.2710.

Google Scholar

[3] Digital Image Processing: An Algorithmic Introduction using Java, edit by Wilhelm Burger,Mark James Burge, Springer 2010. 2.

Google Scholar

[4] Duan Lijuan, Cui Guoqin, Gao Wen, Zhang Hongming. A Hierarchical Method for Nude Image Filtering[J]. Journal Of Computer-Aided Design & Computer graphics. Vol 14(2002), p.404.

Google Scholar

[5] Chai D. Ngan K.N. Loacting facial region of a head-hand-shoulders color image. In Proceedings of the 3rd International Conference on Automatin Face and Gesture Recognition. Nara, Japan. (1998), p.124.

DOI: 10.1109/afgr.1998.670936

Google Scholar

[6] PENG Guo-fu, LlN Zheng-hao. Research and implementation of Gamma Correction in Image Processing. Electronics Engineer, Vol 32(2006), p.30.

Google Scholar