Measure of the Optical and Electrical Properties of Semiconductor SiO₂ Nano-Crystalline by Using Photo-Acoustic Technology

Abstract:

By using a new type of single-beam normalized photo-acoustic spectroscopy that with weak signal detection and non-invasive testing, the photo-acoustic spectroscopy of semiconductor SiO₂ nano-crystals was measured，the measured spectra of semiconductor SiO₂ nano-crystals absorption coefficient was 0.20, and powders band gap is 3.4eV. The TEM image shows that the semiconductor SiO₂ nano-crystals are round lump structure, while the grain size of the semiconductor SiO₂ nano-crystals is about 70x200 nm, and the average particle size after the reunion is 100x300 nm. Compared with their micron crystal, the optical and electrical properties of semiconductor nano-crystals and nano-particle size are closely related. By changing the size of semiconductor nano-crystals, the mix could achieve the goal of changing the optical and electrical properties. Because of the semiconductor SiO₂ nano-crystals‘ special properties of optics and electronics and photo-semiconductor nano-materials, they are widely used in many areas of modern science and technology.

• Periodical: Advanced Materials Research (Volumes 415-417)
• Pages: 2156-2159
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.415-417.2156
• Online since: December 2011
• Authors: Guang Hua Lie, Zhi Lie Tang, Gan Wen Lie, Ting Yang, Xiu Wen Tang
• Keywords: Bandgap, Nanoparticle, Optical Property, Photo-Acoustic Spectroscopy, Semiconductor SiO₂ Nano-Crystalline Powder, Silica Dioxide (SiO₂), TEM

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