Dielectric and Impedance Spectroscopic Studies of SrBi_4-xLa_xTi₄O₁₅

Abstract:

Ceramic samples of SrBi_4-xLa_xTi₄O₁₅ with x=0.025 is prepared by standard solid state reaction method. The phase formation is confirmed by X-ray diffraction (XRD) studies. The Dielectric and Impedance measurement has been performed in the temperature range 50°C to 600°C and the frequency range 1Hz to 1MHz. The Curie temperature is found to decrease from 535°C to 505°C. The Cole-Cole plots are semi circles in the temperature range 450°C to600°C. The relaxation time is decreased with increase of temperature. The investigations on this material at high temperatures and frequencies reveal its stable behavior.

• Periodical: Advanced Materials Research (Volume 428)
• Pages: 52-56
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.428.52
• Online since: January 2012
• Authors: K. Ashok, Pasala Sarah, V.S. Raju
• Keywords: Curie Temperature, Debye-Behavior, Dielectric Measurements, Impedance Spectroscopy, X-Ray Diffraction (XRD)

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