Investigation into Hardness and Young’s Modulus of Thin Films of Lead Germanium Telluride

Bin Li; Ping Xie; Su Ying Zhang; Ding Quan Liu

doi:10.4028/www.scientific.net/AMR.455-456.8

Paper Titles

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Investigation into Hardness and Young’s Modulus of Thin Films of Lead Germanium Telluride
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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 455-456Investigation into Hardness and Young’s Modulus of...

Investigation into Hardness and Young’s Modulus of Thin Films of Lead Germanium Telluride

Abstract:

A mechanically robust infrared high-index coating material is essential to the infrared interference coatings. Lead germanium telluride (Pb_1-xGe_xTe) is a pseudo-binary alloy of IV-VI narrow gap semiconductors of PbTe and GeTe. In our investigation, the hardness and Young’s modulus of thin films of Pb_1-xGe_xTe, which were deposited on silicon substrates using electron beam evaporation, were identified by means of nanoindentation measurement. It is demonstrated that layers of Pb_1-xGe_xTe have greater hardness and Young’s modulus compared with those of PbTe. These mechanical behaviors of layers can be linked to a ferroelectric phase transition from a cubic paraelectric phase to a rhombohedral, ferroelectric phase. Moreover, the strength loss in the layers of Pb_1-xGe_xTe can be also explained in light of strong localized elastic-strain fields in concentrated solid solutions.

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Periodical:

Advanced Materials Research (Volumes 455-456)

Pages:

8-12

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.455-456.8

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Online since:

January 2012

Authors:

Bin Li, Ping Xie, Su Ying Zhang, Ding Quan Liu

Keywords:

Coating Materials, Ferroelectric Phase Transition, Lead Germanium Telluride, Nanoindentation

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