Buffer Layer Effects on the Structure and Morphology of SmCo/Cu Thin Films

Qi Ping Zhang; Qing Qing Fang; Wei Na Wang; Qing Rong Lv; Yan Mei Liu; Han Ming Zhang

doi:10.4028/www.scientific.net/AMR.476-478.2415

Paper Titles

Preparation and Characterization of TiO₂ Photocatalytic Thin Film Prepared by Sol-Gel Dip Coating
p.2398

Effects of Ce Doping on the Properties of ZnO Thin Films Prepared by DC Reactive Magnetron Sputtering
p.2403

The Characterization of TiO₂ Films Prepared by Pyrolysis
p.2407

Wuxi Hui-Quan Substation Three-Dimensional Modeling and GIS System Implementation
p.2411

Buffer Layer Effects on the Structure and Morphology of SmCo/Cu Thin Films
p.2415

Preparation and Mechanical Characterization of Nanocrystalline Diamond Films on Aluminum Oxide Substrates
p.2419

An Integrated Evaluative Function and Water Bloom Predicting and Prewarning System
p.2427

Grey Relational Grade Analysis between Vickers Hardness and Fatigue Crack Growth Data of 2024-T351 Aluminum Alloy
p.2435

Studies of Ti-15V-3Cr-3Al-3Sn after Thermohydrogen Processing
p.2440

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 476-478Buffer Layer Effects on the Structure and...

Buffer Layer Effects on the Structure and Morphology of SmCo/Cu Thin Films

Abstract:

In this paper, we investigated the structure of SmCo films with different thickness and the effects of Cr buffer layer on the structure and morphology of SmCo/Cu thin films. Our data revealed that the magnetic properties of the samples were enhanced by the crystallization of SmCo which was promoted by the optimized Cu underlayers. We also found that the surface roughness can be decreased by Cr layer and the texture can be improved by prolonging the annealing time for thick SmCo film. Thus, we concluded that the magnetic properties of SmCo/Cu films can be further optimized by varying the thickness of Cr buffer layers.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Advanced Materials Research (Volumes 476-478)

Pages:

2415-2418

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.476-478.2415

Citation:

Cite this paper

Online since:

February 2012

Authors:

Qi Ping Zhang, Qing Qing Fang, Wei Na Wang, Qing Rong Lv, Yan Mei Liu, Han Ming Zhang

Keywords:

Buffer Layer, Microstructure, Morpholoy, SmCo Film

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] M. Nakano, K. Yamaguchi, T. Yanai, F. Yamashita, H. Fukunaga: J. Appl. Phys. Vol. 105 (2009), 07A729

Google Scholar

[2] Mitsuru Ohtake, Yuri Nukaga, Fumiyoshi Kirino, Masaaki Futamoto: J. Appl. Phys. Vol. 107 (2010), 09A706

Google Scholar

[3] Junichi Sayama, Kazuki Mizutani, Toru Asahi, Jun Ariake, Kazuhiro Ouchi, Tetsuya Osaka: J. Magn. Magn. Mater. Vol. 301 (2006), p.271

Google Scholar

[4] Isamu Kato, Shigeto Takei, Xiaoxi Liu, and Akimitsu Morisako: IEEE, Trans. Magn. Vol. 42 (2006), p.2366

Google Scholar

[5] J. Sayama, K. Miztutani, T. Asahi, T. Osaka: Appl. Phys. Lett. Vol. 85 (2004), p.5640

Google Scholar

[6] L. N. Zhang, J. F. Hu, J. S. Chen, J. Ding: J. Appl. Phys. Vol. 105 (2009), 07A743

Google Scholar

[7] A. Morisako, I. Kato, S. Takei, X. Liu: J. Magn. Magn. Mater. Vol. 303 (2006), p. e274

Google Scholar

[8] Thanassis Speliotis, Dimitris Niarchos: J. Magn. Magn. Mater. Vol. 290-291 (2005), p.1195

Google Scholar

[9] Akimitsu Morisako, Xiaoxi Liu: J. Magn. Magn. Mater. Vol. 304 (2006), p.46

Google Scholar

[10] A. Singh, R. Tamm, V. Neu, S. Fähler, C.-G. Oertel, W. Skrotzki, L. Schultz, B. Holzapfel: J. Appl. Phys. Vol. 97 (2005), 093902

Google Scholar

[11] Shigeto Takei, Akimitsu Morisako, and Mitsunori Matsumoto: J. Appl. Phys. Vol. 98 (2000), p.6868

Google Scholar

[12] S. A. Romero, D. R. Cornejo, F. M. Rhen, A. C. Neiva, M. H. Tabacniks, F. P. Missell: J. Appl. Phys. Vol. 87 (2000), p.6965

DOI: 10.1063/1.372901

Google Scholar