A Dynamic Integrity Measurement Scheme Based on XEN

Zhi Gang Si; Ping Li; Xin Chen; Ying Wan

doi:10.4028/www.scientific.net/AMR.482-484.279

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 482-484A Dynamic Integrity Measurement Scheme Based on...

A Dynamic Integrity Measurement Scheme Based on XEN

Abstract:

A trusted computing platform is designed based on XEN virtual machine, and a dynamic integrity measurement scheme is presented using hypercall mechanism. This scheme can solve the deficiency of limited scope or complicated structure comparing with other dynamic integrity measurement schemes.

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Periodical:

Advanced Materials Research (Volumes 482-484)

Pages:

279-286

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.482-484.279

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Online since:

February 2012

Authors:

Zhi Gang Si, Ping Li, Xin Chen, Ying Wan

Keywords:

Dynamic, Integrity Measurement, Trusted Computing, XEN Virtual Machine

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