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A Method of Fabric Defects Detection Based on Biorthogonal Wavelet Lifting Scheme

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Abstract:

A new technique to inspect fabric defects based on biorthogonal wavelet lifting scheme is presented. In order to get fabric defect detection of rapidity and accuracy, the method is applied to constructs biorthogonal wavelet by lifting scheme and extracts the image characteristic features. The results show that its computing speed is increased by an average of 47% compared with the Mallat algorithm. And it overcomes the lack of space symmetry such as the orthogonal wavelet. The experimental results confirm that it can efficiently inspect four kinds of common fabric defects, warp-lacking, weft-lacking, oil stains, and holes with higher inspection speed.

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Advanced Research on Material Engineering and its Application View Preview

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Periodical:

Advanced Materials Research (Volume 485)

Pages:

266-270

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.485.266

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Online since:

February 2012

Authors:

Shu Yue Chen, Ming Qian Xu

Keywords:

Biorthogonal Wavelet, Fabric Defects, Lifting Scheme, Mallat Algorithm

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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References

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