A Method of Fabric Defects Detection Based on Biorthogonal Wavelet Lifting Scheme

Shu Yue Chen; Ming Qian Xu

doi:10.4028/www.scientific.net/AMR.485.266

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 485A Method of Fabric Defects Detection Based on...

A Method of Fabric Defects Detection Based on Biorthogonal Wavelet Lifting Scheme

Abstract:

A new technique to inspect fabric defects based on biorthogonal wavelet lifting scheme is presented. In order to get fabric defect detection of rapidity and accuracy, the method is applied to constructs biorthogonal wavelet by lifting scheme and extracts the image characteristic features. The results show that its computing speed is increased by an average of 47% compared with the Mallat algorithm. And it overcomes the lack of space symmetry such as the orthogonal wavelet. The experimental results confirm that it can efficiently inspect four kinds of common fabric defects, warp-lacking, weft-lacking, oil stains, and holes with higher inspection speed.

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Periodical:

Advanced Materials Research (Volume 485)

Pages:

266-270

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.485.266

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Online since:

February 2012

Authors:

Shu Yue Chen, Ming Qian Xu

Keywords:

Biorthogonal Wavelet, Fabric Defects, Lifting Scheme, Mallat Algorithm

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