Creep-Recovery Behaviors of Anisotropic Conductive Adhesive Film with Temperature and Hygrothermal Aging

Article Preview

Abstract:

The effects of temperature, stress level and hygrothermal aging on the creep-recovery behaviors of anisotropic conductive adhesive film (ACF) were investigated experimentally using a dynamic mechanical analyzer (DMA). It is found that the initial strains, instantaneous strains, and creep or recovery rates increase with increasing temperature,however decrease with increasing hygrothermal aging time. The change of creep or recovery rates at low temperature is apparent, however the creep or recovery rates increase obviously at temperatures above 25 oC with increasing stress level. For the hygrothermal aged ACF, the time to reach steady creep stage or steady recovery stage is reduced significantly compared with the unaged sample. The strain jumps at instantaneous loading decrease visibly and the strain jumps at instantaneous unloading decrease slightly with increasing aging time. And the strain jumps at instantaneous loading and unloading increase with increasing stress level for the unaged and aged ACFs.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

16-21

Citation:

Online since:

April 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] H. Nishida, K. Sakamoto, H. Ogawa, Micropitch connection using anisotropic conductive materials for driver IC attachment to a liquid crystal display, IBM J. Res. Develop. 42 (1998) 517-525.

DOI: 10.1147/rd.423.0517

Google Scholar

[2] J. Liu, A. Tolvgard, J. Malmodin, Z. Lai, A reliable and environmentally friendly packaging technology-flip-chip joining using anisotropically conductive adhesive, IEEE Trans. Compon. Packag. Manuf. Technol. 22 (1999)186-190.

DOI: 10.1109/6144.774729

Google Scholar

[3] P. Clot, J.F. Zeberli, J.M. Chenuz, F. Ferrando, D. Styblo, Flip-chip on flex for 3-D packaging, Proc. Elect. Manuf. Tech. Symp. (1999) 36-41.

DOI: 10.1109/iemt.1999.804793

Google Scholar

[4] W.S. Kwon, K.W. Paik, Fundamental understanding of ACF conduction establishment with emphasis on the thermal and mechanical analysis, Int. J. Adhes. Adhes. 24 (2004): 135-142.

DOI: 10.1016/j.ijadhadh.2003.07.003

Google Scholar

[5] J.H. Zhang, Y.C. Chan, Z.M. Zeng, Y.W. Chiu, Research on the interfacial reaction between anisotropically conductive film and bumpless die, IEEE Electr. Components Technol. Conference, (2002)1569-1574.

DOI: 10.1109/ectc.2002.1008316

Google Scholar

[6] K. Pinardi, Z. Lai, D. Vogel, Y.L. Kang, J. Liu, S. Liu, R. Haug, M. Willander, Effect of bump height on the strain variation during the thermal cycling test of ACA flip-chip joints, IEEE Trans. Component. Pack. Technol. 23 (2000) 447-451.

DOI: 10.1109/6144.868843

Google Scholar

[7] V.A. Chiriac, T.Y.T. Lee, Transient thermal analysis of an ACF package assembly process, IEEE Trans. Component. Pack. Technol. 24 (2001) 673-681.

DOI: 10.1109/6144.974960

Google Scholar

[8] G. Sarkar, S. Mridha, T.T. Chong, W.Y. Tuck, S.C. Kwan, Flip chip interconnect using anisotropic conductive adhesive, J. Mater. Process Technol. 89-90 (1999) 484-490.

DOI: 10.1016/s0924-0136(99)00136-3

Google Scholar

[9] L.L. Gao, X. Chen, Sh.B. Zhang, H. Gao, Mechanical properties of anisotropic conductive film with strain rate and temperature, Mater. Sci. Eng. A 513-514 (2009) 216-221.

DOI: 10.1016/j.msea.2009.02.002

Google Scholar

[10] L.L. Gao, X. Chen, H. Gao, S.B. Zhang, Description of nonlinear viscoelastic behavior and creep rupture time of anisotropic conductive film, Mater. Sci. Eng. A 527 (2010) 5115-5121.

DOI: 10.1016/j.msea.2010.05.002

Google Scholar

[11] Y.H. Mei, X. Chen, H. Gao, Hygrothermal effects on the tensile properties of anisotropic conductive films, J. Electron. Mater. 38 (2009) 2415-2426.

DOI: 10.1007/s11664-009-0893-1

Google Scholar