GAAS Semiconductor Laser Ceramics Finish Measuring Instrument

Xiao Wei Hu

doi:10.4028/www.scientific.net/AMR.588-589.688

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 588-589GAAS Semiconductor Laser Ceramics Finish Measuring...

GAAS Semiconductor Laser Ceramics Finish Measuring Instrument

Abstract:

China is a large ceramics, gallium arsenide semiconductor laser ceramics finish measuring instrument is convenient, automatic and accurate. It can finish the measurement of the ceramics and glass continuously. This measuring instrument has several characteristics such as miniaturizing, automatically scan, high-precision measuring, strong anti-interference, be easy to use. And, it will have broad application prospects.

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Periodical:

Advanced Materials Research (Volumes 588-589)

Pages:

688-691

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.588-589.688

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Online since:

November 2012

Authors:

Xiao Wei Hu

Keywords:

Dynamic Semiconductor, Laser Scanning Measurement

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