Multiple Bad Data Identification Based on Partition and Partition Re-Combination

Abstract:

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As the existing methods can not effectively identify multiple bad data, this paper presents a method based on grid partition to detect bad data, and then uses partition re-combination method to identify bad data.

Info:

Periodical:

Advanced Materials Research (Volumes 614-615)

Edited by:

Mojie Sun, Gangui Yan and Yingjie Zhang

Pages:

747-750

Citation:

J. Y. Zang et al., "Multiple Bad Data Identification Based on Partition and Partition Re-Combination", Advanced Materials Research, Vols. 614-615, pp. 747-750, 2013

Online since:

December 2012

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Price:

$38.00

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