Microstructural Evolution of AuSn20/Ni Joint during Annealing

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Abstract:

The AuSn20 (mass fraction) solder was prepared by laminate rolling-annealing method, the AuSn20/Ni solder joints were prepared by the reflow process. The effects of the aging times and temperatures on the microstructure and shear strength of the AuSn20/Ni joints were investigated by the scanning electron microscope (SEM) with an energy dispersive X-ray (EDX). The results show that, the AuSn20 solder is composed of lamellar ζ-Au5Sn and δ-AuSn phases after preparing and the melting point approximates to the eutectic temperature of Au-20Sn alloy. A eutectic ζ-Au5Sn+δ-AuSn microstructure forms in the solder matrix and hexagon (Ni,Au)3Sn2 intermetallics nuclear at the as-reflowed joint. Then the AuSn20/Ni joint was aged at 150 and 200 °C for various times,and the thickness of the IMC layer at 150 °C changes few with the aging time increasing from 150 h to 1000 h, however, it grows rapidly at 200 °C.

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Advanced Materials Research (Volumes 634-638)

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2865-2871

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January 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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