Micro Vibration Sensor Based on the Nano Measuring Machine

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Abstract:

External micro vibration is an important obstacle factor for the measuring result of scanning tunneling microscopy. In order to achieve better result, the influence of vibration must be eliminated. In this study, a large range new sensor with two nano stages is built up to detect the micro vibration for the compensation of the results. Finnaly, the vibration detection experiments are made to illustrate the rationality of the sensor.

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149-152

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January 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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