Image Registration Method Based on PCA-SIFT Feature Detection

Yan Wei Wang; Hui Li Yu

doi:10.4028/www.scientific.net/AMR.712-715.2395

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 712-715Image Registration Method Based on PCA-SIFT...

Image Registration Method Based on PCA-SIFT Feature Detection

Abstract:

SIFT (scale invariant key points) which can well handle images with varying orientation and zoom, is widely used in image registration, but the algorithm is complexity and the processing time is too long. Therefore we used the PCA-SIFT (Principle Components Analysis-scale invariant key points) in image registration. Compared the SIFT descriptor, the PCA-SIFT reduced the dimensions of SIFT feature, enhanced the matching accuracy and reduce the elapsed time. Then the mutual information method used in this paper to estimate the best points. Experimental results show that PCA-SIFT algorithm is simplified, robust and liable.

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Periodical:

Advanced Materials Research (Volumes 712-715)

Pages:

2395-2398

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.712-715.2395

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Online since:

June 2013

Authors:

Yan Wei Wang*, Hui Li Yu

Keywords:

Feature Point, Mage Registration, Mutual Information (MI), PCA-SIFT

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