Analog Circuits Fault Diagnosis Using Multifractal Analysis

Yong Kui Sun; Zhi Bin Yu

doi:10.4028/www.scientific.net/AMR.721.367

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 721Analog Circuits Fault Diagnosis Using Multifractal...

Analog Circuits Fault Diagnosis Using Multifractal Analysis

Abstract:

Analog circuits fault diagnosis using multifractal analysis is presented in this paper. The faulty response of circuit under test is analyzed by multifratal formalism, and the fault feature consists of multifractal spectrum parameters. Support vector machine is used to identify the faults. Experimental results prove the proposed method is effective and the diagnosis accuracy reaches 98%.

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Periodical:

Advanced Materials Research (Volume 721)

Pages:

367-371

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.721.367

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Online since:

July 2013

Authors:

Yong Kui Sun, Zhi Bin Yu

Keywords:

Analog Circuits, Fault Diagnosis, Multifractal Analysis, Support Vector Machine (SVM)

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