Analog Circuits Fault Diagnosis Using Multifractal Analysis

Abstract:

Article Preview

Analog circuits fault diagnosis using multifractal analysis is presented in this paper. The faulty response of circuit under test is analyzed by multifratal formalism, and the fault feature consists of multifractal spectrum parameters. Support vector machine is used to identify the faults. Experimental results prove the proposed method is effective and the diagnosis accuracy reaches 98%.

Info:

Periodical:

Edited by:

Qingzhou Xu

Pages:

367-371

DOI:

10.4028/www.scientific.net/AMR.721.367

Citation:

Y. K. Sun and Z. B. Yu, "Analog Circuits Fault Diagnosis Using Multifractal Analysis", Advanced Materials Research, Vol. 721, pp. 367-371, 2013

Online since:

July 2013

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Price:

$35.00

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