Microfluid Permittivity Measurement Based on On-Chip CPW with Finite Metal Thickness

Huan Zou; Hai Yang Wang

doi:10.4028/www.scientific.net/AMR.722.296

Paper Titles

Diesel Engine Fault Diagnosis Based on Rough Sets
p.276

Simulation Design of Transformer Differential Protection Based on Mat Lab
p.282

Fault Location Algorithm of the 10kV Rural Network Based on Power Frequency Communication
p.287

Generating Device Based on Theory of Semiconductor Thermoelectric Generation
p.292

Microfluid Permittivity Measurement Based on On-Chip CPW with Finite Metal Thickness
p.296

Modeling on Threat Assessment System of Reentry-Course Ballistic Missile
p.301

Station Deployment and Signal Filter Design for Performance Evaluation of Indoor Positioning System
p.306

Analysis of Thyristor Switched Three-Phase Capacitor
p.311

Health Monitoring and Reinforcement of the Cold and Dry Area Roads and Bridges
p.317

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 722Microfluid Permittivity Measurement Based on...

Microfluid Permittivity Measurement Based on On-Chip CPW with Finite Metal Thickness

Abstract:

A new method of permittivity measurement based on the on-chip coplanar waveguide (CPW) with finite metal thickness without close box or microfluid channel is presented in this paper. The material under test (MUT) is directly located in the slot line of the CPW which is considered to be the strongest field distribution area. The proposed structure sample is simulated through HFSS. The simulation results agree well especially when the metal thickness is comparable with the slot line width, the errors are less than 5%.

You might also be interested in these eBooks

Optical, Electronic Materials and Applications IV

View Preview

Info:

Periodical:

Advanced Materials Research (Volume 722)

Pages:

296-300

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.722.296

Citation:

Cite this paper

Online since:

July 2013

Authors:

Huan Zou, Hai Yang Wang

Keywords:

Coplanar Waveguide, Finite Metal Thickness, Microfluide, Permittivity

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] G. C. Facer, D. A. Notterman, L. L. Sohn.. Appl. Lett., Vol.78(2001), pp: 996-998

Google Scholar

[2] J. Baker-Jarvis. NIST Tech. Note,2005, p.1536

Google Scholar

[3] Baker-Jarvis J, Vanzura E J, Kissick W A. IEEE Trans. on MTT, Vol.38(1990),pp:1096-103

Google Scholar

[4] Nicolson A M, Ross G F. IEEE Trans. Instrum. Meas., Vol.19(1970), pp:377-382

Google Scholar

[5] S. Okamura, Y. Zhang, N. Tsukamoto. Meas. Sci. Technol. Vol.18 (2007), pp:1022-1028

Google Scholar

[6] J. Mateu, N. Orloff, etc. IEEE MIT-S Int. Microwave Symp. Dig., (2007), pp:523-526

Google Scholar

[7] J. J. Shah, S. G. Sundaresan, etc. Micromech. Microeng. Vol.17(2007), pp:2224-2230

Google Scholar

[8] T. Akalin, S. Arscott, etc. Proc. Of 2006 IEEE-EMBS Int. Conf. On Microtechnologies in Medicine and Biology, MMB 2006, Bankoku-Shinryokan, Okinawa, Japan, 2006, pp:252-255

Google Scholar

[9] D. Debuisson, A. Treizebré, etc. Physiological Measurement, Vol.29(2008), pp:213-225

Google Scholar

[10] S. Seo,T. Stintzing, I. Block etc. Microwave Symposium Digest, 2008 IEEE MTT-S International, 2008, pp:915-918

Google Scholar

[11] E.Chen, S. Y. Chou. IEEE Transactions on MTT., Vol. 45(6) (1997), pp: 939-945

Google Scholar

[12] C.Veyres, V.Fouad Hanna. Int. J. Electronics, Vol.48(1)(1980):pp: 47-56

Google Scholar

[13] Yungseon Eo, William R. Eisenstadt. Vol.16(5)(1993), pp:555-562

Google Scholar